JPS5376887A - Ion microanalyzer - Google Patents
Ion microanalyzerInfo
- Publication number
- JPS5376887A JPS5376887A JP15199176A JP15199176A JPS5376887A JP S5376887 A JPS5376887 A JP S5376887A JP 15199176 A JP15199176 A JP 15199176A JP 15199176 A JP15199176 A JP 15199176A JP S5376887 A JPS5376887 A JP S5376887A
- Authority
- JP
- Japan
- Prior art keywords
- reflecting mirror
- ion microanalyzer
- ion
- microanalyzer
- insertable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
- H01J37/228—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object whereby illumination and light collection take place in the same area of the discharge
Abstract
PURPOSE:To reduce the contamination of a reflecting mirror produced by the materials flying off from the specimen by movably constituting a stereoscopic microscope in such a way that its reflecting mirror is insertable to the passage where ion beam passes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15199176A JPS5376887A (en) | 1976-12-20 | 1976-12-20 | Ion microanalyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15199176A JPS5376887A (en) | 1976-12-20 | 1976-12-20 | Ion microanalyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5376887A true JPS5376887A (en) | 1978-07-07 |
Family
ID=15530662
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15199176A Pending JPS5376887A (en) | 1976-12-20 | 1976-12-20 | Ion microanalyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5376887A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4829178A (en) * | 1987-03-30 | 1989-05-09 | Vg Instruments Group Limited | Apparatus for surface analysis |
-
1976
- 1976-12-20 JP JP15199176A patent/JPS5376887A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4829178A (en) * | 1987-03-30 | 1989-05-09 | Vg Instruments Group Limited | Apparatus for surface analysis |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
IT8050362A0 (en) | MULTIFUNCTION SERVO ACTUATOR FOR AIRCRAFT ESPECIALLY FOR HELICOPTERS | |
JPS5248331A (en) | Scanning system with light beam | |
AU538348B2 (en) | Laser knife with liquid beam stop | |
GB1339846A (en) | Apparatus for the optical qualities of a laser beam | |
JPS5226844A (en) | Microscope | |
JPS5376887A (en) | Ion microanalyzer | |
JPS5363699A (en) | Machining apparatus in use of laser beam | |
JPS527746A (en) | Multifocal-point microscope | |
JPS5331955A (en) | Transmission scanning particle beam microscope | |
JPS52137257A (en) | Electron microscope | |
JPS5326192A (en) | Compound analyzer | |
JPS52126243A (en) | Multifocus microscope | |
JPS5342047A (en) | Scanner of optical beam | |
GB1493133A (en) | Preparation of specimens to be examined by electron microscopy techniques | |
GB844702A (en) | Improvements in stereoscopic microscopes | |
JPS5289382A (en) | Ion micro-analizer | |
GB1100228A (en) | Light control means for use with a giant pulse laser | |
JPS52143046A (en) | Matching of laser beam shapes | |
JPS52116189A (en) | Excitation light condenser unit for coloring matter laser | |
JPS5359485A (en) | Reflection type electron-diffraction apparatus | |
JPS5748230A (en) | Electron ray exposure | |
JPS53130995A (en) | Radar system of mono pulse phased array | |
JPS5212847A (en) | Light beam polarizer | |
JPS5324262A (en) | Objective lens for electronic microscope | |
JPS5359484A (en) | Reflection type electron-diffraction apparatus |