JPS5376744A - Crystal evaluation method - Google Patents
Crystal evaluation methodInfo
- Publication number
- JPS5376744A JPS5376744A JP15193576A JP15193576A JPS5376744A JP S5376744 A JPS5376744 A JP S5376744A JP 15193576 A JP15193576 A JP 15193576A JP 15193576 A JP15193576 A JP 15193576A JP S5376744 A JPS5376744 A JP S5376744A
- Authority
- JP
- Japan
- Prior art keywords
- evaluation method
- crystal evaluation
- pellet
- crystal
- evalutate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To evalutate the distortion of a pellet by applying a polarized ray from the mirror-surface polished pellet side face and observing the light emerging from the other side pahse through an analyzer.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15193576A JPS5376744A (en) | 1976-12-20 | 1976-12-20 | Crystal evaluation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15193576A JPS5376744A (en) | 1976-12-20 | 1976-12-20 | Crystal evaluation method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5376744A true JPS5376744A (en) | 1978-07-07 |
Family
ID=15529408
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15193576A Pending JPS5376744A (en) | 1976-12-20 | 1976-12-20 | Crystal evaluation method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5376744A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0318733A (en) * | 1989-06-16 | 1991-01-28 | Hitachi Ltd | Method and device for stress monitoring |
JPH06148005A (en) * | 1992-04-07 | 1994-05-27 | Internatl Business Mach Corp <Ibm> | Apparatus and method for optical strain mapping |
-
1976
- 1976-12-20 JP JP15193576A patent/JPS5376744A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0318733A (en) * | 1989-06-16 | 1991-01-28 | Hitachi Ltd | Method and device for stress monitoring |
JPH06148005A (en) * | 1992-04-07 | 1994-05-27 | Internatl Business Mach Corp <Ibm> | Apparatus and method for optical strain mapping |
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