JPS5375870A - Semiconductor device measuring jig - Google Patents

Semiconductor device measuring jig

Info

Publication number
JPS5375870A
JPS5375870A JP15094776A JP15094776A JPS5375870A JP S5375870 A JPS5375870 A JP S5375870A JP 15094776 A JP15094776 A JP 15094776A JP 15094776 A JP15094776 A JP 15094776A JP S5375870 A JPS5375870 A JP S5375870A
Authority
JP
Japan
Prior art keywords
semiconductor device
measuring jig
device measuring
oscillation
high frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15094776A
Other languages
Japanese (ja)
Inventor
Hirokazu Kurono
Katsutoshi Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP15094776A priority Critical patent/JPS5375870A/en
Publication of JPS5375870A publication Critical patent/JPS5375870A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To prevent the oscillation of a semiconductor element and stabilize characteristic measurement by providing a resistor near probe and absorbing high frequency signals.
COPYRIGHT: (C)1978,JPO&Japio
JP15094776A 1976-12-17 1976-12-17 Semiconductor device measuring jig Pending JPS5375870A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15094776A JPS5375870A (en) 1976-12-17 1976-12-17 Semiconductor device measuring jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15094776A JPS5375870A (en) 1976-12-17 1976-12-17 Semiconductor device measuring jig

Publications (1)

Publication Number Publication Date
JPS5375870A true JPS5375870A (en) 1978-07-05

Family

ID=15507886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15094776A Pending JPS5375870A (en) 1976-12-17 1976-12-17 Semiconductor device measuring jig

Country Status (1)

Country Link
JP (1) JPS5375870A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59204246A (en) * 1983-05-03 1984-11-19 ウエントワ−ス・ラボラトリ−ズ，インコ−ポレイテツド Test probe assembly
JPS6221064A (en) * 1985-07-19 1987-01-29 Koichi Yoshida Spring-contact type probe
JPS62153768A (en) * 1985-12-27 1987-07-08 Tokyo Tungsten Co Ltd Probe pin
JPH04359532A (en) * 1991-06-06 1992-12-11 Nec Yamagata Ltd Oscillation-preventing probe card

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59204246A (en) * 1983-05-03 1984-11-19 ウエントワ−ス・ラボラトリ−ズ，インコ−ポレイテツド Test probe assembly
JPS6221064A (en) * 1985-07-19 1987-01-29 Koichi Yoshida Spring-contact type probe
JPS62153768A (en) * 1985-12-27 1987-07-08 Tokyo Tungsten Co Ltd Probe pin
JPH04359532A (en) * 1991-06-06 1992-12-11 Nec Yamagata Ltd Oscillation-preventing probe card

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