JPS5364092A - Element analyzer - Google Patents
Element analyzerInfo
- Publication number
- JPS5364092A JPS5364092A JP13833376A JP13833376A JPS5364092A JP S5364092 A JPS5364092 A JP S5364092A JP 13833376 A JP13833376 A JP 13833376A JP 13833376 A JP13833376 A JP 13833376A JP S5364092 A JPS5364092 A JP S5364092A
- Authority
- JP
- Japan
- Prior art keywords
- element analyzer
- indicating
- frame
- crt
- signal due
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To correctly confirm the analyzing position by indicating a frame in a CRT and by indicating the brightness signal due to Auger electrons within the frame.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13833376A JPS5364092A (en) | 1976-11-19 | 1976-11-19 | Element analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13833376A JPS5364092A (en) | 1976-11-19 | 1976-11-19 | Element analyzer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5364092A true JPS5364092A (en) | 1978-06-08 |
Family
ID=15219446
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13833376A Pending JPS5364092A (en) | 1976-11-19 | 1976-11-19 | Element analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5364092A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60218845A (en) * | 1984-04-16 | 1985-11-01 | Hitachi Ltd | Apparatus for testing foreign matter |
-
1976
- 1976-11-19 JP JP13833376A patent/JPS5364092A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60218845A (en) * | 1984-04-16 | 1985-11-01 | Hitachi Ltd | Apparatus for testing foreign matter |
JPH0458622B2 (en) * | 1984-04-16 | 1992-09-18 | Hitachi Ltd |
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