JPS5347746A - Analysis of pollutant diffusion state and its device - Google Patents

Analysis of pollutant diffusion state and its device

Info

Publication number
JPS5347746A
JPS5347746A JP12329876A JP12329876A JPS5347746A JP S5347746 A JPS5347746 A JP S5347746A JP 12329876 A JP12329876 A JP 12329876A JP 12329876 A JP12329876 A JP 12329876A JP S5347746 A JPS5347746 A JP S5347746A
Authority
JP
Japan
Prior art keywords
analysis
pollutant diffusion
diffusion state
pollutant
progress
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12329876A
Other languages
Japanese (ja)
Other versions
JPS5856148B2 (en
Inventor
Tetsuhiro Sumimoto
Sadakazu Kawamura
Kazuhiro Sumimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Denshi KK
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Hitachi Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology, Hitachi Denshi KK filed Critical Agency of Industrial Science and Technology
Priority to JP51123298A priority Critical patent/JPS5856148B2/en
Publication of JPS5347746A publication Critical patent/JPS5347746A/en
Publication of JPS5856148B2 publication Critical patent/JPS5856148B2/en
Expired legal-status Critical Current

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  • Image Analysis (AREA)

Abstract

PURPOSE: To obtain a device, which can ensure a high-speed data collection with a high accuracy and simplification by obtaining the difference of the concentration between the two screens in the course of the pollution progress and which can perform an automatic 2-dimensional analysis for the pollutant diffusion progress state by using computers, etc.
COPYRIGHT: (C)1978,JPO&Japio
JP51123298A 1976-10-13 1976-10-13 Analysis method and equipment for contaminant diffusion status Expired JPS5856148B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51123298A JPS5856148B2 (en) 1976-10-13 1976-10-13 Analysis method and equipment for contaminant diffusion status

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51123298A JPS5856148B2 (en) 1976-10-13 1976-10-13 Analysis method and equipment for contaminant diffusion status

Publications (2)

Publication Number Publication Date
JPS5347746A true JPS5347746A (en) 1978-04-28
JPS5856148B2 JPS5856148B2 (en) 1983-12-13

Family

ID=14857067

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51123298A Expired JPS5856148B2 (en) 1976-10-13 1976-10-13 Analysis method and equipment for contaminant diffusion status

Country Status (1)

Country Link
JP (1) JPS5856148B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62243062A (en) * 1986-04-16 1987-10-23 Meidensha Electric Mfg Co Ltd Learning function device
JPH0273472A (en) * 1988-09-09 1990-03-13 Nec Corp Picture processor for automatically calculating blasting position
JPH11144042A (en) * 1997-11-12 1999-05-28 Naoki Harigai Method for finding new flaw of rental car and flaw finding device for implementing same method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62243062A (en) * 1986-04-16 1987-10-23 Meidensha Electric Mfg Co Ltd Learning function device
JPH0273472A (en) * 1988-09-09 1990-03-13 Nec Corp Picture processor for automatically calculating blasting position
JPH11144042A (en) * 1997-11-12 1999-05-28 Naoki Harigai Method for finding new flaw of rental car and flaw finding device for implementing same method

Also Published As

Publication number Publication date
JPS5856148B2 (en) 1983-12-13

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