JPS5344077A - Method of compensating sensitivity of probe type eddy current flaw detector - Google Patents
Method of compensating sensitivity of probe type eddy current flaw detectorInfo
- Publication number
- JPS5344077A JPS5344077A JP11851976A JP11851976A JPS5344077A JP S5344077 A JPS5344077 A JP S5344077A JP 11851976 A JP11851976 A JP 11851976A JP 11851976 A JP11851976 A JP 11851976A JP S5344077 A JPS5344077 A JP S5344077A
- Authority
- JP
- Japan
- Prior art keywords
- eddy current
- flaw detector
- current flaw
- probe type
- type eddy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11851976A JPS5344077A (en) | 1976-10-04 | 1976-10-04 | Method of compensating sensitivity of probe type eddy current flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11851976A JPS5344077A (en) | 1976-10-04 | 1976-10-04 | Method of compensating sensitivity of probe type eddy current flaw detector |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5344077A true JPS5344077A (en) | 1978-04-20 |
Family
ID=14738622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11851976A Pending JPS5344077A (en) | 1976-10-04 | 1976-10-04 | Method of compensating sensitivity of probe type eddy current flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5344077A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55113947A (en) * | 1979-02-26 | 1980-09-02 | Electron Kiyooto:Kk | Flaw detector for cast iron pipe |
JPS55114299A (en) * | 1979-02-26 | 1980-09-03 | Chin Shiyokuhai | Honey fractionating apparatus |
JPS61191814U (en) * | 1985-05-22 | 1986-11-29 | ||
JPH04357453A (en) * | 1990-02-05 | 1992-12-10 | Inst Dr F Foerster Pruefgeraet Gmbh | Eddy current tester |
JPH07167838A (en) * | 1993-08-18 | 1995-07-04 | Micro Epsilon Messtechnik Gmbh & Co Kg | Arrangement of sensor for examining physical property of surface layer of metal object and method therefor |
JP2002181507A (en) * | 2000-12-18 | 2002-06-26 | Ulvac Japan Ltd | Inductance measuring instrument |
JP2008304471A (en) * | 2000-03-28 | 2008-12-18 | Toshiba Corp | Film thickness measuring device, film thickness measuring method, and recording medium |
JP2011252877A (en) * | 2010-06-04 | 2011-12-15 | Jtekt Corp | Eddy current inspection device and eddy current inspection method |
JPWO2017154141A1 (en) * | 2016-03-09 | 2018-08-02 | 三菱電機株式会社 | Floor slab flaw detector |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4885188A (en) * | 1972-02-14 | 1973-11-12 |
-
1976
- 1976-10-04 JP JP11851976A patent/JPS5344077A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4885188A (en) * | 1972-02-14 | 1973-11-12 |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55113947A (en) * | 1979-02-26 | 1980-09-02 | Electron Kiyooto:Kk | Flaw detector for cast iron pipe |
JPS55114299A (en) * | 1979-02-26 | 1980-09-03 | Chin Shiyokuhai | Honey fractionating apparatus |
JPS579360B2 (en) * | 1979-02-26 | 1982-02-20 | ||
JPS61191814U (en) * | 1985-05-22 | 1986-11-29 | ||
JPH04357453A (en) * | 1990-02-05 | 1992-12-10 | Inst Dr F Foerster Pruefgeraet Gmbh | Eddy current tester |
JPH07167838A (en) * | 1993-08-18 | 1995-07-04 | Micro Epsilon Messtechnik Gmbh & Co Kg | Arrangement of sensor for examining physical property of surface layer of metal object and method therefor |
JP2008304471A (en) * | 2000-03-28 | 2008-12-18 | Toshiba Corp | Film thickness measuring device, film thickness measuring method, and recording medium |
JP2002181507A (en) * | 2000-12-18 | 2002-06-26 | Ulvac Japan Ltd | Inductance measuring instrument |
JP2011252877A (en) * | 2010-06-04 | 2011-12-15 | Jtekt Corp | Eddy current inspection device and eddy current inspection method |
JPWO2017154141A1 (en) * | 2016-03-09 | 2018-08-02 | 三菱電機株式会社 | Floor slab flaw detector |
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