JPS5344077A - Method of compensating sensitivity of probe type eddy current flaw detector - Google Patents

Method of compensating sensitivity of probe type eddy current flaw detector

Info

Publication number
JPS5344077A
JPS5344077A JP11851976A JP11851976A JPS5344077A JP S5344077 A JPS5344077 A JP S5344077A JP 11851976 A JP11851976 A JP 11851976A JP 11851976 A JP11851976 A JP 11851976A JP S5344077 A JPS5344077 A JP S5344077A
Authority
JP
Japan
Prior art keywords
eddy current
flaw detector
current flaw
probe type
type eddy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11851976A
Other languages
Japanese (ja)
Inventor
Katsuhiko Shimada
Takeo Yamada
Seigo Andou
Takanobu Tomikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kokan Ltd filed Critical Nippon Kokan Ltd
Priority to JP11851976A priority Critical patent/JPS5344077A/en
Publication of JPS5344077A publication Critical patent/JPS5344077A/en
Pending legal-status Critical Current

Links

JP11851976A 1976-10-04 1976-10-04 Method of compensating sensitivity of probe type eddy current flaw detector Pending JPS5344077A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11851976A JPS5344077A (en) 1976-10-04 1976-10-04 Method of compensating sensitivity of probe type eddy current flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11851976A JPS5344077A (en) 1976-10-04 1976-10-04 Method of compensating sensitivity of probe type eddy current flaw detector

Publications (1)

Publication Number Publication Date
JPS5344077A true JPS5344077A (en) 1978-04-20

Family

ID=14738622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11851976A Pending JPS5344077A (en) 1976-10-04 1976-10-04 Method of compensating sensitivity of probe type eddy current flaw detector

Country Status (1)

Country Link
JP (1) JPS5344077A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55113947A (en) * 1979-02-26 1980-09-02 Electron Kiyooto:Kk Flaw detector for cast iron pipe
JPS55114299A (en) * 1979-02-26 1980-09-03 Chin Shiyokuhai Honey fractionating apparatus
JPS61191814U (en) * 1985-05-22 1986-11-29
JPH04357453A (en) * 1990-02-05 1992-12-10 Inst Dr F Foerster Pruefgeraet Gmbh Eddy current tester
JPH07167838A (en) * 1993-08-18 1995-07-04 Micro Epsilon Messtechnik Gmbh & Co Kg Arrangement of sensor for examining physical property of surface layer of metal object and method therefor
JP2002181507A (en) * 2000-12-18 2002-06-26 Ulvac Japan Ltd Inductance measuring instrument
JP2008304471A (en) * 2000-03-28 2008-12-18 Toshiba Corp Film thickness measuring device, film thickness measuring method, and recording medium
JP2011252877A (en) * 2010-06-04 2011-12-15 Jtekt Corp Eddy current inspection device and eddy current inspection method
JPWO2017154141A1 (en) * 2016-03-09 2018-08-02 三菱電機株式会社 Floor slab flaw detector

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4885188A (en) * 1972-02-14 1973-11-12

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4885188A (en) * 1972-02-14 1973-11-12

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55113947A (en) * 1979-02-26 1980-09-02 Electron Kiyooto:Kk Flaw detector for cast iron pipe
JPS55114299A (en) * 1979-02-26 1980-09-03 Chin Shiyokuhai Honey fractionating apparatus
JPS579360B2 (en) * 1979-02-26 1982-02-20
JPS61191814U (en) * 1985-05-22 1986-11-29
JPH04357453A (en) * 1990-02-05 1992-12-10 Inst Dr F Foerster Pruefgeraet Gmbh Eddy current tester
JPH07167838A (en) * 1993-08-18 1995-07-04 Micro Epsilon Messtechnik Gmbh & Co Kg Arrangement of sensor for examining physical property of surface layer of metal object and method therefor
JP2008304471A (en) * 2000-03-28 2008-12-18 Toshiba Corp Film thickness measuring device, film thickness measuring method, and recording medium
JP2002181507A (en) * 2000-12-18 2002-06-26 Ulvac Japan Ltd Inductance measuring instrument
JP2011252877A (en) * 2010-06-04 2011-12-15 Jtekt Corp Eddy current inspection device and eddy current inspection method
JPWO2017154141A1 (en) * 2016-03-09 2018-08-02 三菱電機株式会社 Floor slab flaw detector

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