JPS52100257A - Insertion type probe for eddy current flaw detection - Google Patents

Insertion type probe for eddy current flaw detection

Info

Publication number
JPS52100257A
JPS52100257A JP1720376A JP1720376A JPS52100257A JP S52100257 A JPS52100257 A JP S52100257A JP 1720376 A JP1720376 A JP 1720376A JP 1720376 A JP1720376 A JP 1720376A JP S52100257 A JPS52100257 A JP S52100257A
Authority
JP
Japan
Prior art keywords
eddy current
flaw detection
type probe
insertion type
current flaw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1720376A
Other languages
Japanese (ja)
Other versions
JPS5833500B2 (en
Inventor
Eiichi Inada
Naoki Tsunoda
Hisataka Andou
Toshinao Takei
Akira Tani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKUSHU TORYO KK
Doryokuro Kakunenryo Kaihatsu Jigyodan
Original Assignee
TOKUSHU TORYO KK
Doryokuro Kakunenryo Kaihatsu Jigyodan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOKUSHU TORYO KK, Doryokuro Kakunenryo Kaihatsu Jigyodan filed Critical TOKUSHU TORYO KK
Priority to JP51017203A priority Critical patent/JPS5833500B2/en
Publication of JPS52100257A publication Critical patent/JPS52100257A/en
Publication of JPS5833500B2 publication Critical patent/JPS5833500B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP51017203A 1976-02-19 1976-02-19 Internal punch type probe for eddy current flaw detection Expired JPS5833500B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51017203A JPS5833500B2 (en) 1976-02-19 1976-02-19 Internal punch type probe for eddy current flaw detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51017203A JPS5833500B2 (en) 1976-02-19 1976-02-19 Internal punch type probe for eddy current flaw detection

Publications (2)

Publication Number Publication Date
JPS52100257A true JPS52100257A (en) 1977-08-23
JPS5833500B2 JPS5833500B2 (en) 1983-07-20

Family

ID=11937367

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51017203A Expired JPS5833500B2 (en) 1976-02-19 1976-02-19 Internal punch type probe for eddy current flaw detection

Country Status (1)

Country Link
JP (1) JPS5833500B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5942966U (en) * 1982-09-13 1984-03-21 古河電気工業株式会社 Inner probe for eddy current flaw detection
JPS5942967U (en) * 1982-09-13 1984-03-21 古河電気工業株式会社 Inner probe for eddy current flaw detection

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49125792U (en) * 1973-02-22 1974-10-28

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49125792U (en) * 1973-02-22 1974-10-28

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5942966U (en) * 1982-09-13 1984-03-21 古河電気工業株式会社 Inner probe for eddy current flaw detection
JPS5942967U (en) * 1982-09-13 1984-03-21 古河電気工業株式会社 Inner probe for eddy current flaw detection

Also Published As

Publication number Publication date
JPS5833500B2 (en) 1983-07-20

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