JPS5326518B1 - - Google Patents

Info

Publication number
JPS5326518B1
JPS5326518B1 JP3155472A JP3155472A JPS5326518B1 JP S5326518 B1 JPS5326518 B1 JP S5326518B1 JP 3155472 A JP3155472 A JP 3155472A JP 3155472 A JP3155472 A JP 3155472A JP S5326518 B1 JPS5326518 B1 JP S5326518B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3155472A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5326518B1 publication Critical patent/JPS5326518B1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/12Coulter-counters
    • G01N15/13
JP3155472A 1971-04-07 1972-03-29 Pending JPS5326518B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13192371A 1971-04-07 1971-04-07

Publications (1)

Publication Number Publication Date
JPS5326518B1 true JPS5326518B1 (en) 1978-08-02

Family

ID=22451620

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3155472A Pending JPS5326518B1 (en) 1971-04-07 1972-03-29

Country Status (9)

Country Link
US (1) US3746976A (en)
JP (1) JPS5326518B1 (en)
CA (2) CA941450A (en)
CH (1) CH552804A (en)
DE (1) DE2215486C3 (en)
FR (1) FR2132670B1 (en)
GB (1) GB1341366A (en)
NL (1) NL165844C (en)
SE (1) SE380350B (en)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3902115A (en) * 1973-09-26 1975-08-26 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
US4001678A (en) * 1974-05-16 1977-01-04 Berg Robert H Displacement metering with independent ancillary flow
US3930736A (en) * 1974-07-01 1976-01-06 Coulter Electronics, Inc. Aperture tube with attached thief
US4014611A (en) * 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
IL53921A (en) * 1977-02-15 1979-12-30 Coulter Electronics Electronic particle sensing aperture module with perforated electrode
US4090128A (en) * 1977-02-15 1978-05-16 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4237416A (en) * 1977-03-22 1980-12-02 Becton Dickinson And Company Apparatus for counting and sizing particles suspended in a liquid electrolyte
US4180091A (en) * 1977-11-18 1979-12-25 Becton, Dickinson And Company Purging means for aperture of blood cell counter
US4361803A (en) * 1980-08-26 1982-11-30 Coulter Electronics, Inc. Apparatus for recirculating sweep flow electrolyte without a pump
DE3233055C2 (en) * 1982-09-06 1994-07-28 Coulter Electronics Flow device for examining individual particles suspended in a liquid
US4503385A (en) * 1983-07-11 1985-03-05 Becton, Dickinson And Company Apparatus and method for regulating sheath fluid flow in a hydrodynamically focused fluid flow system
US4710021A (en) * 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
JPS61124850A (en) * 1984-11-21 1986-06-12 Eruma Kogaku Kk Apparatus for measuring impurities in ultra-pure water
US5094818A (en) * 1989-05-04 1992-03-10 Exact Science, Inc. Self-filling anti-siphon flow system for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
AU1258595A (en) * 1993-12-23 1995-07-10 Abbott Laboratories Method of making a stress relieved count probe
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
GB9405028D0 (en) * 1994-03-15 1994-04-27 Counting Tech Ltd Fluid diluter
US5895869A (en) * 1995-11-17 1999-04-20 Mwi, Inc. Method and apparatus for analyzing particulate matter
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3299354A (en) * 1962-07-05 1967-01-17 Coulter Electronics Aperture tube structure for particle study apparatus
US3583209A (en) * 1969-02-27 1971-06-08 Automation Prod Method of and apparatus for measuring mass of a material

Also Published As

Publication number Publication date
NL165844C (en) 1981-05-15
CH552804A (en) 1974-08-15
CA1042511B (en) 1978-11-14
DE2215486A1 (en) 1972-10-12
FR2132670B1 (en) 1973-06-29
US3746976A (en) 1973-07-17
DE2215486C3 (en) 1980-09-18
CA941450A (en) 1974-02-05
NL165844B (en) 1980-12-15
GB1341366A (en) 1973-12-19
FR2132670A1 (en) 1972-11-24
DE2215486B2 (en) 1980-01-24
NL7204208A (en) 1972-10-10
SE380350B (en) 1975-11-03

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