CH552804A - APPARATUS FOR ANALYSIS OF PARTICLES IN SUSPENSION IN A LIQUID. - Google Patents

APPARATUS FOR ANALYSIS OF PARTICLES IN SUSPENSION IN A LIQUID.

Info

Publication number
CH552804A
CH552804A CH464672A CH464672A CH552804A CH 552804 A CH552804 A CH 552804A CH 464672 A CH464672 A CH 464672A CH 464672 A CH464672 A CH 464672A CH 552804 A CH552804 A CH 552804A
Authority
CH
Switzerland
Prior art keywords
suspension
particles
analysis
liquid
Prior art date
Application number
CH464672A
Other languages
French (fr)
Original Assignee
Coulter Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics filed Critical Coulter Electronics
Publication of CH552804A publication Critical patent/CH552804A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13Details pertaining to apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CH464672A 1971-04-07 1972-03-29 APPARATUS FOR ANALYSIS OF PARTICLES IN SUSPENSION IN A LIQUID. CH552804A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13192371A 1971-04-07 1971-04-07

Publications (1)

Publication Number Publication Date
CH552804A true CH552804A (en) 1974-08-15

Family

ID=22451620

Family Applications (1)

Application Number Title Priority Date Filing Date
CH464672A CH552804A (en) 1971-04-07 1972-03-29 APPARATUS FOR ANALYSIS OF PARTICLES IN SUSPENSION IN A LIQUID.

Country Status (9)

Country Link
US (1) US3746976A (en)
JP (1) JPS5326518B1 (en)
CA (2) CA941450A (en)
CH (1) CH552804A (en)
DE (1) DE2215486C3 (en)
FR (1) FR2132670B1 (en)
GB (1) GB1341366A (en)
NL (1) NL165844C (en)
SE (1) SE380350B (en)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3902115A (en) * 1973-09-26 1975-08-26 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
US4001678A (en) * 1974-05-16 1977-01-04 Berg Robert H Displacement metering with independent ancillary flow
US3930736A (en) * 1974-07-01 1976-01-06 Coulter Electronics, Inc. Aperture tube with attached thief
US4014611A (en) * 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
IL53921A (en) * 1977-02-15 1979-12-30 Coulter Electronics Electronic particle sensing aperture module with perforated electrode
US4090128A (en) * 1977-02-15 1978-05-16 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4237416A (en) * 1977-03-22 1980-12-02 Becton Dickinson And Company Apparatus for counting and sizing particles suspended in a liquid electrolyte
US4180091A (en) * 1977-11-18 1979-12-25 Becton, Dickinson And Company Purging means for aperture of blood cell counter
US4361803A (en) * 1980-08-26 1982-11-30 Coulter Electronics, Inc. Apparatus for recirculating sweep flow electrolyte without a pump
DE3233055C2 (en) * 1982-09-06 1994-07-28 Coulter Electronics Flow device for examining individual particles suspended in a liquid
US4503385A (en) * 1983-07-11 1985-03-05 Becton, Dickinson And Company Apparatus and method for regulating sheath fluid flow in a hydrodynamically focused fluid flow system
US4710021A (en) * 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
JPS61124850A (en) * 1984-11-21 1986-06-12 Eruma Kogaku Kk Apparatus for measuring impurities in ultra-pure water
US5094818A (en) * 1989-05-04 1992-03-10 Exact Science, Inc. Self-filling anti-siphon flow system for particle analysis
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
WO1995017659A1 (en) * 1993-12-23 1995-06-29 Abbott Laboratories Method of making a stress relieved count probe
GB9405028D0 (en) * 1994-03-15 1994-04-27 Counting Tech Ltd Fluid diluter
US5895869A (en) * 1995-11-17 1999-04-20 Mwi, Inc. Method and apparatus for analyzing particulate matter
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3299354A (en) * 1962-07-05 1967-01-17 Coulter Electronics Aperture tube structure for particle study apparatus
US3583209A (en) * 1969-02-27 1971-06-08 Automation Prod Method of and apparatus for measuring mass of a material

Also Published As

Publication number Publication date
JPS5326518B1 (en) 1978-08-02
NL165844C (en) 1981-05-15
US3746976A (en) 1973-07-17
DE2215486C3 (en) 1980-09-18
DE2215486B2 (en) 1980-01-24
SE380350B (en) 1975-11-03
GB1341366A (en) 1973-12-19
FR2132670A1 (en) 1972-11-24
DE2215486A1 (en) 1972-10-12
NL165844B (en) 1980-12-15
NL7204208A (en) 1972-10-10
CA941450A (en) 1974-02-05
FR2132670B1 (en) 1973-06-29
CA1042511B (en) 1978-11-14

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Legal Events

Date Code Title Description
PL Patent ceased