JPS5322427B2 - - Google Patents
Info
- Publication number
- JPS5322427B2 JPS5322427B2 JP10247175A JP10247175A JPS5322427B2 JP S5322427 B2 JPS5322427 B2 JP S5322427B2 JP 10247175 A JP10247175 A JP 10247175A JP 10247175 A JP10247175 A JP 10247175A JP S5322427 B2 JPS5322427 B2 JP S5322427B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Manufacturing Of Printed Circuit Boards (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10247175A JPS5226171A (en) | 1975-08-22 | 1975-08-22 | Mask creation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10247175A JPS5226171A (en) | 1975-08-22 | 1975-08-22 | Mask creation method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5226171A JPS5226171A (en) | 1977-02-26 |
JPS5322427B2 true JPS5322427B2 (zh) | 1978-07-08 |
Family
ID=14328353
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10247175A Granted JPS5226171A (en) | 1975-08-22 | 1975-08-22 | Mask creation method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5226171A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009200510A (ja) * | 2001-03-28 | 2009-09-03 | Freescale Semiconductor Inc | リソグラフィックテンプレート |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6873087B1 (en) * | 1999-10-29 | 2005-03-29 | Board Of Regents, The University Of Texas System | High precision orientation alignment and gap control stages for imprint lithography processes |
AU2001277907A1 (en) * | 2000-07-17 | 2002-01-30 | Board Of Regents, The University Of Texas System | Method and system of automatic fluid dispensing for imprint lithography processes |
JP2005153091A (ja) * | 2003-11-27 | 2005-06-16 | Hitachi Ltd | 転写方法及び転写装置 |
US7676088B2 (en) * | 2004-12-23 | 2010-03-09 | Asml Netherlands B.V. | Imprint lithography |
US7686970B2 (en) | 2004-12-30 | 2010-03-30 | Asml Netherlands B.V. | Imprint lithography |
US7354698B2 (en) * | 2005-01-07 | 2008-04-08 | Asml Netherlands B.V. | Imprint lithography |
US7517211B2 (en) | 2005-12-21 | 2009-04-14 | Asml Netherlands B.V. | Imprint lithography |
JP2008177082A (ja) * | 2007-01-19 | 2008-07-31 | Mitsubishi Electric Corp | 接点開閉器 |
-
1975
- 1975-08-22 JP JP10247175A patent/JPS5226171A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009200510A (ja) * | 2001-03-28 | 2009-09-03 | Freescale Semiconductor Inc | リソグラフィックテンプレート |
Also Published As
Publication number | Publication date |
---|---|
JPS5226171A (en) | 1977-02-26 |