JPS53143357A - Inspection apparatus for surface - Google Patents
Inspection apparatus for surfaceInfo
- Publication number
- JPS53143357A JPS53143357A JP5834978A JP5834978A JPS53143357A JP S53143357 A JPS53143357 A JP S53143357A JP 5834978 A JP5834978 A JP 5834978A JP 5834978 A JP5834978 A JP 5834978A JP S53143357 A JPS53143357 A JP S53143357A
- Authority
- JP
- Japan
- Prior art keywords
- inspection apparatus
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2083577A GB1592511A (en) | 1977-05-18 | 1977-05-18 | Surface inspection apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53143357A true JPS53143357A (en) | 1978-12-13 |
Family
ID=10152503
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5834978A Pending JPS53143357A (en) | 1977-05-18 | 1978-05-18 | Inspection apparatus for surface |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPS53143357A (de) |
DE (1) | DE2820910A1 (de) |
GB (1) | GB1592511A (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0560167U (ja) * | 1991-12-27 | 1993-08-06 | 愛知電機株式会社 | 電動機の速度検出素子取付装置 |
JPH0884457A (ja) * | 1995-06-09 | 1996-03-26 | Hitachi Ltd | 速度検出器付モータ |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
LU81728A1 (fr) * | 1979-09-26 | 1981-04-17 | Centre Rech Metallurgique | Procede pour controler la qualite des surfaces revetues ou non |
DE3006072C2 (de) * | 1980-02-19 | 1984-11-29 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Fehlstellenermittlungsvorrichtung für Materialbahnen |
DE3037622A1 (de) * | 1980-10-04 | 1982-04-22 | Theodor Prof. Dr.-Ing. 1000 Berlin Gast | Optoelektronisches messverfahren und einrichtungen zum bestimmen der oberflaechenguete streuend reflektierender oberflaechen |
DE3134264A1 (de) * | 1981-08-29 | 1983-03-10 | Peter Dr.-Ing. 6718 Grünstadt Decker | Vorrichtung zur erfassung der feuchtwassermenge in offsetmaschinen |
DD208670A1 (de) * | 1982-06-29 | 1984-04-04 | Pentacon Dresden Veb | Vorrichtung zur schnellen messung des glanzes beliebiger oberflaechen |
DE8303856U1 (de) * | 1983-02-11 | 1985-11-14 | Optische Werke G. Rodenstock, 8000 Muenchen | Vorrichtung zur Ermittlung einer Oberflächenstruktur, insbesondere der Rauheit |
DE3337468A1 (de) * | 1983-10-14 | 1985-04-25 | Optische Werke G. Rodenstock, 8000 München | Verfahren und vorrichtung zur pruefung der oberflaeche von bauteilen |
US4718760A (en) * | 1984-08-18 | 1988-01-12 | Kabushiki Kaisha Machida Seisakusho | Apparatus for optically inspecting object having reflecting surface |
GB2173300B (en) * | 1985-04-06 | 1989-06-28 | Schaudt Maschinenbau Gmbh | Apparatus for optically monitoring the surface finish of ground workpieces |
DE3712513A1 (de) * | 1987-04-13 | 1988-11-03 | Roth Electric Gmbh | Verfahren und vorrichtung zur erkennung von oberflaechenfehlern |
JPH07107481B2 (ja) * | 1987-05-21 | 1995-11-15 | アンリツ株式会社 | 変位測定装置 |
DE3925614A1 (de) * | 1989-08-02 | 1991-02-07 | Sick Optik Elektronik Erwin | Optische abtastvorrichtung zur fehlersuche an durchlaufenden materialbahnen |
US5088821A (en) * | 1990-06-29 | 1992-02-18 | Nicolas J. Harrick | Spectroscopic analysis system with remote terminals |
DE4320845C1 (de) * | 1993-06-23 | 1994-10-27 | Fraunhofer Ges Forschung | Anordnung zur Messung von Streulicht in Bohrungen von Werkstücken oder in Rohren |
CN111442753B (zh) * | 2020-03-24 | 2021-08-31 | 石家庄铁源工程咨询有限公司 | 一种高速铁路连续梁线性的测量方法、处理装置及存储介质 |
CN116858141B (zh) * | 2023-09-02 | 2023-12-05 | 江苏迪牌新材料有限公司 | 一种pvc膜的平整度检测装置 |
-
1977
- 1977-05-18 GB GB2083577A patent/GB1592511A/en not_active Expired
-
1978
- 1978-05-12 DE DE19782820910 patent/DE2820910A1/de not_active Withdrawn
- 1978-05-18 JP JP5834978A patent/JPS53143357A/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0560167U (ja) * | 1991-12-27 | 1993-08-06 | 愛知電機株式会社 | 電動機の速度検出素子取付装置 |
JPH0884457A (ja) * | 1995-06-09 | 1996-03-26 | Hitachi Ltd | 速度検出器付モータ |
Also Published As
Publication number | Publication date |
---|---|
GB1592511A (en) | 1981-07-08 |
DE2820910A1 (de) | 1978-11-30 |
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