JPS53138675A - Scan-type electronic microscope - Google Patents
Scan-type electronic microscopeInfo
- Publication number
- JPS53138675A JPS53138675A JP5393077A JP5393077A JPS53138675A JP S53138675 A JPS53138675 A JP S53138675A JP 5393077 A JP5393077 A JP 5393077A JP 5393077 A JP5393077 A JP 5393077A JP S53138675 A JPS53138675 A JP S53138675A
- Authority
- JP
- Japan
- Prior art keywords
- scan
- type electronic
- electronic microscope
- unevenness
- variation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To secure a simultaneous correction for both the reference level and the signal component, by correcting the unevenness of the electron beam or the unevenness of the detector through variation of the amplifying rate of the amplifier or variation of the detecting efficiency of the detector respectively.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5393077A JPS53138675A (en) | 1977-05-10 | 1977-05-10 | Scan-type electronic microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5393077A JPS53138675A (en) | 1977-05-10 | 1977-05-10 | Scan-type electronic microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53138675A true JPS53138675A (en) | 1978-12-04 |
Family
ID=12956440
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5393077A Pending JPS53138675A (en) | 1977-05-10 | 1977-05-10 | Scan-type electronic microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53138675A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60140642A (en) * | 1983-12-28 | 1985-07-25 | Jeol Ltd | Scanning electron microscope |
-
1977
- 1977-05-10 JP JP5393077A patent/JPS53138675A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60140642A (en) * | 1983-12-28 | 1985-07-25 | Jeol Ltd | Scanning electron microscope |
JPH0234424B2 (en) * | 1983-12-28 | 1990-08-03 | Nippon Electron Optics Lab |
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