JPS53118089A - Defect detecting method - Google Patents

Defect detecting method

Info

Publication number
JPS53118089A
JPS53118089A JP3241777A JP3241777A JPS53118089A JP S53118089 A JPS53118089 A JP S53118089A JP 3241777 A JP3241777 A JP 3241777A JP 3241777 A JP3241777 A JP 3241777A JP S53118089 A JPS53118089 A JP S53118089A
Authority
JP
Japan
Prior art keywords
detecting method
defect detecting
width direction
light
regulates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3241777A
Other languages
Japanese (ja)
Other versions
JPS6013137B2 (en
Inventor
Masaaki Sakaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP52032417A priority Critical patent/JPS6013137B2/en
Publication of JPS53118089A publication Critical patent/JPS53118089A/en
Publication of JPS6013137B2 publication Critical patent/JPS6013137B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Abstract

PURPOSE:To make possible the correction of the change in the quantity of light in a width direction simply and positively by inserting an optical filter which regulates the quantity of receiving light of a photo detector so that it becomes constant over the entire length in its width direction.
JP52032417A 1977-03-24 1977-03-24 Defect detection method Expired JPS6013137B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52032417A JPS6013137B2 (en) 1977-03-24 1977-03-24 Defect detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52032417A JPS6013137B2 (en) 1977-03-24 1977-03-24 Defect detection method

Publications (2)

Publication Number Publication Date
JPS53118089A true JPS53118089A (en) 1978-10-16
JPS6013137B2 JPS6013137B2 (en) 1985-04-05

Family

ID=12358363

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52032417A Expired JPS6013137B2 (en) 1977-03-24 1977-03-24 Defect detection method

Country Status (1)

Country Link
JP (1) JPS6013137B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59155540U (en) * 1983-04-05 1984-10-18 三菱電機株式会社 Defect inspection equipment
US6714296B2 (en) 2001-10-25 2004-03-30 Fuji Photo Film. Co., Ltd. Method and apparatus for inspecting photosensitive material for surface defects
JP2017011246A (en) * 2015-06-26 2017-01-12 リンテック株式会社 Light irradiation device and light irradiation method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0412984Y2 (en) * 1989-09-11 1992-03-27

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50149367A (en) * 1974-05-09 1975-11-29

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50149367A (en) * 1974-05-09 1975-11-29

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59155540U (en) * 1983-04-05 1984-10-18 三菱電機株式会社 Defect inspection equipment
US6714296B2 (en) 2001-10-25 2004-03-30 Fuji Photo Film. Co., Ltd. Method and apparatus for inspecting photosensitive material for surface defects
JP2017011246A (en) * 2015-06-26 2017-01-12 リンテック株式会社 Light irradiation device and light irradiation method

Also Published As

Publication number Publication date
JPS6013137B2 (en) 1985-04-05

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