JPS53108275A - Scanning electronic microscope - Google Patents
Scanning electronic microscopeInfo
- Publication number
- JPS53108275A JPS53108275A JP2264977A JP2264977A JPS53108275A JP S53108275 A JPS53108275 A JP S53108275A JP 2264977 A JP2264977 A JP 2264977A JP 2264977 A JP2264977 A JP 2264977A JP S53108275 A JPS53108275 A JP S53108275A
- Authority
- JP
- Japan
- Prior art keywords
- electronic microscope
- scanning electronic
- scanning
- microscope
- perspective
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2264977A JPS53108275A (en) | 1977-03-04 | 1977-03-04 | Scanning electronic microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2264977A JPS53108275A (en) | 1977-03-04 | 1977-03-04 | Scanning electronic microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS53108275A true JPS53108275A (en) | 1978-09-20 |
Family
ID=12088688
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2264977A Pending JPS53108275A (en) | 1977-03-04 | 1977-03-04 | Scanning electronic microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53108275A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0104593A2 (de) * | 1982-09-27 | 1984-04-04 | Siemens Aktiengesellschaft | Verfahren zum Hervorheben eines Objektbereichs in einem Rastermikroskop |
JPS5983335A (ja) * | 1982-11-05 | 1984-05-14 | Akashi Seisakusho Co Ltd | 試料像の傾斜増幅表示装置 |
-
1977
- 1977-03-04 JP JP2264977A patent/JPS53108275A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0104593A2 (de) * | 1982-09-27 | 1984-04-04 | Siemens Aktiengesellschaft | Verfahren zum Hervorheben eines Objektbereichs in einem Rastermikroskop |
JPS5983335A (ja) * | 1982-11-05 | 1984-05-14 | Akashi Seisakusho Co Ltd | 試料像の傾斜増幅表示装置 |
JPH0234423B2 (ja) * | 1982-11-05 | 1990-08-03 | Akashi Seisakusho Kk |
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