JPS53107392A - Compound analyzer using excitation beam - Google Patents
Compound analyzer using excitation beamInfo
- Publication number
- JPS53107392A JPS53107392A JP2198077A JP2198077A JPS53107392A JP S53107392 A JPS53107392 A JP S53107392A JP 2198077 A JP2198077 A JP 2198077A JP 2198077 A JP2198077 A JP 2198077A JP S53107392 A JPS53107392 A JP S53107392A
- Authority
- JP
- Japan
- Prior art keywords
- excitation beam
- excitation
- compound analyzer
- excitation beams
- beams
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005284 excitation Effects 0.000 title abstract 5
- 150000001875 compounds Chemical class 0.000 title 1
- 230000003287 optical effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2198077A JPS53107392A (en) | 1977-02-28 | 1977-02-28 | Compound analyzer using excitation beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2198077A JPS53107392A (en) | 1977-02-28 | 1977-02-28 | Compound analyzer using excitation beam |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS53107392A true JPS53107392A (en) | 1978-09-19 |
JPS613067B2 JPS613067B2 (enrdf_load_stackoverflow) | 1986-01-29 |
Family
ID=12070162
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2198077A Granted JPS53107392A (en) | 1977-02-28 | 1977-02-28 | Compound analyzer using excitation beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS53107392A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56138242A (en) * | 1980-03-31 | 1981-10-28 | Shimadzu Corp | X-ray photoelectron analysis equipment |
JPH02131650U (enrdf_load_stackoverflow) * | 1989-12-07 | 1990-11-01 |
-
1977
- 1977-02-28 JP JP2198077A patent/JPS53107392A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56138242A (en) * | 1980-03-31 | 1981-10-28 | Shimadzu Corp | X-ray photoelectron analysis equipment |
JPH02131650U (enrdf_load_stackoverflow) * | 1989-12-07 | 1990-11-01 |
Also Published As
Publication number | Publication date |
---|---|
JPS613067B2 (enrdf_load_stackoverflow) | 1986-01-29 |
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