JPS5279072U - - Google Patents
Info
- Publication number
- JPS5279072U JPS5279072U JP16657575U JP16657575U JPS5279072U JP S5279072 U JPS5279072 U JP S5279072U JP 16657575 U JP16657575 U JP 16657575U JP 16657575 U JP16657575 U JP 16657575U JP S5279072 U JPS5279072 U JP S5279072U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Assembled Shelves (AREA)
- Cabinets, Racks, Or The Like Of Rigid Construction (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16657575U JPS5738855Y2 (en:Method) | 1975-12-10 | 1975-12-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16657575U JPS5738855Y2 (en:Method) | 1975-12-10 | 1975-12-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5279072U true JPS5279072U (en:Method) | 1977-06-13 |
| JPS5738855Y2 JPS5738855Y2 (en:Method) | 1982-08-26 |
Family
ID=44261796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16657575U Expired JPS5738855Y2 (en:Method) | 1975-12-10 | 1975-12-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5738855Y2 (en:Method) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60253199A (ja) * | 1984-03-16 | 1985-12-13 | エヌ・ベ−・オプテイツシエ・インダストリエ・“デ・オ−デ・デルフト” | Ｘ線写真装置 |
| JP2018528586A (ja) * | 2015-09-10 | 2018-09-27 | アメリカン サイエンス アンド エンジニアリング, インコーポレイテッドAmerican Science and Engineering, Inc. | 行間適応電磁ｘ線走査を用いた後方散乱特性評価 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50109692A (en:Method) * | 1974-02-04 | 1975-08-28 |
-
1975
- 1975-12-10 JP JP16657575U patent/JPS5738855Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50109692A (en:Method) * | 1974-02-04 | 1975-08-28 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60253199A (ja) * | 1984-03-16 | 1985-12-13 | エヌ・ベ−・オプテイツシエ・インダストリエ・“デ・オ−デ・デルフト” | Ｘ線写真装置 |
| JP2018528586A (ja) * | 2015-09-10 | 2018-09-27 | アメリカン サイエンス アンド エンジニアリング, インコーポレイテッドAmerican Science and Engineering, Inc. | 行間適応電磁ｘ線走査を用いた後方散乱特性評価 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5738855Y2 (en:Method) | 1982-08-26 |