JPS5264749U - - Google Patents
Info
- Publication number
- JPS5264749U JPS5264749U JP15193075U JP15193075U JPS5264749U JP S5264749 U JPS5264749 U JP S5264749U JP 15193075 U JP15193075 U JP 15193075U JP 15193075 U JP15193075 U JP 15193075U JP S5264749 U JPS5264749 U JP S5264749U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15193075U JPS5734458Y2 (en:Method) | 1975-11-07 | 1975-11-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15193075U JPS5734458Y2 (en:Method) | 1975-11-07 | 1975-11-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5264749U true JPS5264749U (en:Method) | 1977-05-13 |
| JPS5734458Y2 JPS5734458Y2 (en:Method) | 1982-07-29 |
Family
ID=28631250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15193075U Expired JPS5734458Y2 (en:Method) | 1975-11-07 | 1975-11-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5734458Y2 (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5727041A (en) * | 1980-07-25 | 1982-02-13 | Hitachi Ltd | Large-scale integrated circuit having testing function |
| JPS5745471A (en) * | 1980-09-02 | 1982-03-15 | Nec Corp | Testing circuit for semiconductor integrated circuit |
| JPS58207648A (ja) * | 1982-05-28 | 1983-12-03 | Toshiba Corp | 集積回路のテストモ−ド設定回路 |
-
1975
- 1975-11-07 JP JP15193075U patent/JPS5734458Y2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5727041A (en) * | 1980-07-25 | 1982-02-13 | Hitachi Ltd | Large-scale integrated circuit having testing function |
| JPS5745471A (en) * | 1980-09-02 | 1982-03-15 | Nec Corp | Testing circuit for semiconductor integrated circuit |
| JPS58207648A (ja) * | 1982-05-28 | 1983-12-03 | Toshiba Corp | 集積回路のテストモ−ド設定回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5734458Y2 (en:Method) | 1982-07-29 |