JPS5264749U - - Google Patents

Info

Publication number
JPS5264749U
JPS5264749U JP15193075U JP15193075U JPS5264749U JP S5264749 U JPS5264749 U JP S5264749U JP 15193075 U JP15193075 U JP 15193075U JP 15193075 U JP15193075 U JP 15193075U JP S5264749 U JPS5264749 U JP S5264749U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15193075U
Other languages
Japanese (ja)
Other versions
JPS5734458Y2 (enrdf_load_html_response
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15193075U priority Critical patent/JPS5734458Y2/ja
Publication of JPS5264749U publication Critical patent/JPS5264749U/ja
Application granted granted Critical
Publication of JPS5734458Y2 publication Critical patent/JPS5734458Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15193075U 1975-11-07 1975-11-07 Expired JPS5734458Y2 (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15193075U JPS5734458Y2 (enrdf_load_html_response) 1975-11-07 1975-11-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15193075U JPS5734458Y2 (enrdf_load_html_response) 1975-11-07 1975-11-07

Publications (2)

Publication Number Publication Date
JPS5264749U true JPS5264749U (enrdf_load_html_response) 1977-05-13
JPS5734458Y2 JPS5734458Y2 (enrdf_load_html_response) 1982-07-29

Family

ID=28631250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15193075U Expired JPS5734458Y2 (enrdf_load_html_response) 1975-11-07 1975-11-07

Country Status (1)

Country Link
JP (1) JPS5734458Y2 (enrdf_load_html_response)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5727041A (en) * 1980-07-25 1982-02-13 Hitachi Ltd Large-scale integrated circuit having testing function
JPS5745471A (en) * 1980-09-02 1982-03-15 Nec Corp Testing circuit for semiconductor integrated circuit
JPS58207648A (ja) * 1982-05-28 1983-12-03 Toshiba Corp 集積回路のテストモ−ド設定回路

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5727041A (en) * 1980-07-25 1982-02-13 Hitachi Ltd Large-scale integrated circuit having testing function
JPS5745471A (en) * 1980-09-02 1982-03-15 Nec Corp Testing circuit for semiconductor integrated circuit
JPS58207648A (ja) * 1982-05-28 1983-12-03 Toshiba Corp 集積回路のテストモ−ド設定回路

Also Published As

Publication number Publication date
JPS5734458Y2 (enrdf_load_html_response) 1982-07-29

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