JPS5250134A - Prom tester - Google Patents

Prom tester

Info

Publication number
JPS5250134A
JPS5250134A JP12607475A JP12607475A JPS5250134A JP S5250134 A JPS5250134 A JP S5250134A JP 12607475 A JP12607475 A JP 12607475A JP 12607475 A JP12607475 A JP 12607475A JP S5250134 A JPS5250134 A JP S5250134A
Authority
JP
Japan
Prior art keywords
prom
tester
unit
units
contents
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12607475A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5520314B2 (enExample
Inventor
Hiroo Okuhara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP12607475A priority Critical patent/JPS5250134A/ja
Publication of JPS5250134A publication Critical patent/JPS5250134A/ja
Publication of JPS5520314B2 publication Critical patent/JPS5520314B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP12607475A 1975-10-20 1975-10-20 Prom tester Granted JPS5250134A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12607475A JPS5250134A (en) 1975-10-20 1975-10-20 Prom tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12607475A JPS5250134A (en) 1975-10-20 1975-10-20 Prom tester

Publications (2)

Publication Number Publication Date
JPS5250134A true JPS5250134A (en) 1977-04-21
JPS5520314B2 JPS5520314B2 (enExample) 1980-06-02

Family

ID=14925959

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12607475A Granted JPS5250134A (en) 1975-10-20 1975-10-20 Prom tester

Country Status (1)

Country Link
JP (1) JPS5250134A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56116156A (en) * 1980-02-20 1981-09-11 Toshiba Corp Circuit check system for information processor
JPS62249253A (ja) * 1986-04-23 1987-10-30 Mitsubishi Electric Corp リ−ドオンリ−メモリの内容診断方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5029769A (enExample) * 1973-07-19 1975-03-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5029769A (enExample) * 1973-07-19 1975-03-25

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56116156A (en) * 1980-02-20 1981-09-11 Toshiba Corp Circuit check system for information processor
JPS62249253A (ja) * 1986-04-23 1987-10-30 Mitsubishi Electric Corp リ−ドオンリ−メモリの内容診断方法

Also Published As

Publication number Publication date
JPS5520314B2 (enExample) 1980-06-02

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