JPS5248386A - Defect detecting system - Google Patents

Defect detecting system

Info

Publication number
JPS5248386A
JPS5248386A JP12477275A JP12477275A JPS5248386A JP S5248386 A JPS5248386 A JP S5248386A JP 12477275 A JP12477275 A JP 12477275A JP 12477275 A JP12477275 A JP 12477275A JP S5248386 A JPS5248386 A JP S5248386A
Authority
JP
Japan
Prior art keywords
detecting system
defect detecting
feasilbe
malfunction
prevention
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12477275A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5542701B2 (enExample
Inventor
Takashi Hasebe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Tateisi Electronics Co
Priority to JP12477275A priority Critical patent/JPS5248386A/ja
Publication of JPS5248386A publication Critical patent/JPS5248386A/ja
Publication of JPS5542701B2 publication Critical patent/JPS5542701B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP12477275A 1975-10-15 1975-10-15 Defect detecting system Granted JPS5248386A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12477275A JPS5248386A (en) 1975-10-15 1975-10-15 Defect detecting system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12477275A JPS5248386A (en) 1975-10-15 1975-10-15 Defect detecting system

Publications (2)

Publication Number Publication Date
JPS5248386A true JPS5248386A (en) 1977-04-18
JPS5542701B2 JPS5542701B2 (enExample) 1980-11-01

Family

ID=14893723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12477275A Granted JPS5248386A (en) 1975-10-15 1975-10-15 Defect detecting system

Country Status (1)

Country Link
JP (1) JPS5248386A (enExample)

Also Published As

Publication number Publication date
JPS5542701B2 (enExample) 1980-11-01

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