JPS522573A - Surface potential measuring device - Google Patents
Surface potential measuring deviceInfo
- Publication number
- JPS522573A JPS522573A JP50078085A JP7808575A JPS522573A JP S522573 A JPS522573 A JP S522573A JP 50078085 A JP50078085 A JP 50078085A JP 7808575 A JP7808575 A JP 7808575A JP S522573 A JPS522573 A JP S522573A
- Authority
- JP
- Japan
- Prior art keywords
- measuring device
- surface potential
- potential measuring
- ultra
- contacting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: Measuring device using ultra-violet beam which gives surface electric rotational of minute area without contacting it.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50078085A JPS522573A (en) | 1975-06-24 | 1975-06-24 | Surface potential measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50078085A JPS522573A (en) | 1975-06-24 | 1975-06-24 | Surface potential measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS522573A true JPS522573A (en) | 1977-01-10 |
Family
ID=13651996
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50078085A Pending JPS522573A (en) | 1975-06-24 | 1975-06-24 | Surface potential measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS522573A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61108148A (en) * | 1984-11-01 | 1986-05-26 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Dynamic tester for intermediate body during the manufacture of ic |
JPS61225831A (en) * | 1985-03-29 | 1986-10-07 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Non-contact total line dynamic tester |
JPS6269630A (en) * | 1985-09-23 | 1987-03-30 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Testing device for integrated circuit |
JPH0573579U (en) * | 1991-05-31 | 1993-10-08 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Dynamic test equipment for intermediates during integrated circuit manufacturing |
-
1975
- 1975-06-24 JP JP50078085A patent/JPS522573A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61108148A (en) * | 1984-11-01 | 1986-05-26 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Dynamic tester for intermediate body during the manufacture of ic |
JPS61225831A (en) * | 1985-03-29 | 1986-10-07 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Non-contact total line dynamic tester |
JPH0428138B2 (en) * | 1985-03-29 | 1992-05-13 | Intaanashonaru Bijinesu Mashiinzu Corp | |
JPS6269630A (en) * | 1985-09-23 | 1987-03-30 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Testing device for integrated circuit |
JPH0337301B2 (en) * | 1985-09-23 | 1991-06-05 | Intaanashonaru Bijinesu Mashiinzu Corp | |
JPH0573579U (en) * | 1991-05-31 | 1993-10-08 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Dynamic test equipment for intermediates during integrated circuit manufacturing |
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