JPS5222851A - Circuittnetwork analysis system - Google Patents

Circuittnetwork analysis system

Info

Publication number
JPS5222851A
JPS5222851A JP51096905A JP9690576A JPS5222851A JP S5222851 A JPS5222851 A JP S5222851A JP 51096905 A JP51096905 A JP 51096905A JP 9690576 A JP9690576 A JP 9690576A JP S5222851 A JPS5222851 A JP S5222851A
Authority
JP
Japan
Prior art keywords
circuittnetwork
analysis system
analysis
circuittnetwork analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP51096905A
Other languages
English (en)
Other versions
JPS553672B2 (ja
Inventor
Reisu Niyuuton Sutaaringu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Publication of JPS5222851A publication Critical patent/JPS5222851A/ja
Publication of JPS553672B2 publication Critical patent/JPS553672B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/30—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response with provision for recording characteristics, e.g. by plotting Nyquist diagram

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
JP51096905A 1975-08-14 1976-08-13 Circuittnetwork analysis system Granted JPS5222851A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/604,700 US3990004A (en) 1975-08-14 1975-08-14 Multi-frequency range operation of a network analyzer system

Publications (2)

Publication Number Publication Date
JPS5222851A true JPS5222851A (en) 1977-02-21
JPS553672B2 JPS553672B2 (ja) 1980-01-26

Family

ID=24420663

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51096905A Granted JPS5222851A (en) 1975-08-14 1976-08-13 Circuittnetwork analysis system

Country Status (3)

Country Link
US (1) US3990004A (ja)
JP (1) JPS5222851A (ja)
DE (1) DE2635204C3 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61199853A (ja) * 1985-03-01 1986-09-04 保母　須弥也 金属焼付ポ−セレン泥の製造方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4660150A (en) * 1984-02-16 1987-04-21 Hewlett-Packard Company Spectrum analyzer with improved data analysis and display features
US4695792A (en) * 1985-12-16 1987-09-22 Ecole Polytechnique Method and system for measuring the amplitude and phase angle of harmonics in a periodic signal
US5089782A (en) * 1989-03-22 1992-02-18 Hewlett-Packard Company Vector network analyzer for swept frequency harmonic and mixer conversion loss measurements using either an internal or external signal source
WO1992004669A1 (en) * 1990-09-06 1992-03-19 Drexelbrook Controls Inc. Improved imstrumentation system
US6230106B1 (en) 1999-10-13 2001-05-08 Modulation Instruments Method of characterizing a device under test
US6795010B1 (en) * 2003-07-29 2004-09-21 Renesas Technology America, Inc. Techniques for pausing and resuming analog-to-digital signal conversion
DE102012207021A1 (de) 2012-04-27 2013-10-31 Rohde & Schwarz Gmbh & Co. Kg Messgerät, Kalibriergerät, Messsystem und Verfahren mit dynamischem Datenblatt

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3427535A (en) * 1968-02-19 1969-02-11 Telonic Ind Inc Sweep generator having automatically controlled center frequency

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61199853A (ja) * 1985-03-01 1986-09-04 保母　須弥也 金属焼付ポ−セレン泥の製造方法

Also Published As

Publication number Publication date
DE2635204B2 (de) 1981-04-02
JPS553672B2 (ja) 1980-01-26
DE2635204C3 (de) 1981-11-12
DE2635204A1 (de) 1977-03-03
US3990004A (en) 1976-11-02

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