JPS52150916A - Automatic testing system - Google Patents

Automatic testing system

Info

Publication number
JPS52150916A
JPS52150916A JP6766276A JP6766276A JPS52150916A JP S52150916 A JPS52150916 A JP S52150916A JP 6766276 A JP6766276 A JP 6766276A JP 6766276 A JP6766276 A JP 6766276A JP S52150916 A JPS52150916 A JP S52150916A
Authority
JP
Japan
Prior art keywords
testing system
automatic testing
dial
simplify
facilitate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6766276A
Other languages
Japanese (ja)
Inventor
Masahiko Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6766276A priority Critical patent/JPS52150916A/en
Publication of JPS52150916A publication Critical patent/JPS52150916A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/32—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges
    • H04M3/323—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges for the arrangements providing the connection (test connection, test call, call simulation)

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To simplify the figure setting part such as the dial, etc. which is equipped to the operation surface of the test equipment, and thus to facilitate the memory test for the storage circuit.
JP6766276A 1976-06-11 1976-06-11 Automatic testing system Pending JPS52150916A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6766276A JPS52150916A (en) 1976-06-11 1976-06-11 Automatic testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6766276A JPS52150916A (en) 1976-06-11 1976-06-11 Automatic testing system

Publications (1)

Publication Number Publication Date
JPS52150916A true JPS52150916A (en) 1977-12-15

Family

ID=13351432

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6766276A Pending JPS52150916A (en) 1976-06-11 1976-06-11 Automatic testing system

Country Status (1)

Country Link
JP (1) JPS52150916A (en)

Similar Documents

Publication Publication Date Title
JPS52112383A (en) Automatic chemical testing apparatus
AU3044177A (en) Immunological test procedure
MY8100010A (en) Circuit for automatic dynamic compression or expansion
JPS52150916A (en) Automatic testing system
JPS52128071A (en) Automatic test unit
JPS549846A (en) Tester for automibile electronic controller
JPS5293361A (en) Automatic tester
JPS5323079A (en) Automatic testing device for small noofuse breaker
JPS5384651A (en) Automatic test control system
JPS51132086A (en) Specific characteristics variation testing device
JPS51147937A (en) Logic circuit device
JPS525684A (en) Indicator
JPS5383430A (en) Test method for terminal unit
JPS5410652A (en) Automatic phase controller
JPS5427733A (en) Semiconductor memory tester
JPS52140217A (en) Test equipment
JPS5233440A (en) Automatic wiring test system
JPS5320981A (en) Voltage-withstand tester
JPS5315880A (en) Automatic atmospheric pressure tester
JPS5311090A (en) Solution tester
JPS5339876A (en) Ic tester
JPS5241851A (en) Protective relay apparatus
JPS52144921A (en) Clear circuit
JPS5367086A (en) Logic sequence system
JPS5429539A (en) Test system for integrated circuit