JPS52138257U - - Google Patents

Info

Publication number
JPS52138257U
JPS52138257U JP4695876U JP4695876U JPS52138257U JP S52138257 U JPS52138257 U JP S52138257U JP 4695876 U JP4695876 U JP 4695876U JP 4695876 U JP4695876 U JP 4695876U JP S52138257 U JPS52138257 U JP S52138257U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4695876U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4695876U priority Critical patent/JPS52138257U/ja
Publication of JPS52138257U publication Critical patent/JPS52138257U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP4695876U 1976-04-15 1976-04-15 Pending JPS52138257U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4695876U JPS52138257U (enrdf_load_stackoverflow) 1976-04-15 1976-04-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4695876U JPS52138257U (enrdf_load_stackoverflow) 1976-04-15 1976-04-15

Publications (1)

Publication Number Publication Date
JPS52138257U true JPS52138257U (enrdf_load_stackoverflow) 1977-10-20

Family

ID=28506092

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4695876U Pending JPS52138257U (enrdf_load_stackoverflow) 1976-04-15 1976-04-15

Country Status (1)

Country Link
JP (1) JPS52138257U (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6183966A (ja) * 1984-10-01 1986-04-28 Olympus Optical Co Ltd 電子回路基板の検査装置
JPH0368082U (enrdf_load_stackoverflow) * 1989-11-02 1991-07-03
JPH04184174A (ja) * 1990-11-19 1992-07-01 Graphtec Corp 回路試験装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52122084A (en) * 1976-04-06 1977-10-13 Toshiba Corp Inspection system for semiconductor substrates

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52122084A (en) * 1976-04-06 1977-10-13 Toshiba Corp Inspection system for semiconductor substrates

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6183966A (ja) * 1984-10-01 1986-04-28 Olympus Optical Co Ltd 電子回路基板の検査装置
JPH0368082U (enrdf_load_stackoverflow) * 1989-11-02 1991-07-03
JPH04184174A (ja) * 1990-11-19 1992-07-01 Graphtec Corp 回路試験装置

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