JPS52136649A - Method of and device for inspecting opaque objects - Google Patents

Method of and device for inspecting opaque objects

Info

Publication number
JPS52136649A
JPS52136649A JP5195877A JP5195877A JPS52136649A JP S52136649 A JPS52136649 A JP S52136649A JP 5195877 A JP5195877 A JP 5195877A JP 5195877 A JP5195877 A JP 5195877A JP S52136649 A JPS52136649 A JP S52136649A
Authority
JP
Japan
Prior art keywords
opaque objects
inspecting
inspecting opaque
objects
opaque
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5195877A
Other languages
English (en)
Inventor
Yunku Rainaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
Original Assignee
Robert Bosch GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Publication of JPS52136649A publication Critical patent/JPS52136649A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP5195877A 1976-05-07 1977-05-06 Method of and device for inspecting opaque objects Pending JPS52136649A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19762620240 DE2620240A1 (de) 1976-05-07 1976-05-07 Verfahren und vorrichtung zur pruefung lichtundurchlaessiger werkstuecke

Publications (1)

Publication Number Publication Date
JPS52136649A true JPS52136649A (en) 1977-11-15

Family

ID=5977330

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5195877A Pending JPS52136649A (en) 1976-05-07 1977-05-06 Method of and device for inspecting opaque objects

Country Status (7)

Country Link
US (1) US4171161A (ja)
JP (1) JPS52136649A (ja)
CH (1) CH613278A5 (ja)
DE (1) DE2620240A1 (ja)
FR (1) FR2350579A1 (ja)
IT (1) IT1115299B (ja)
SE (1) SE7705252L (ja)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2908534A1 (de) * 1978-03-09 1979-09-13 British Steel Corp Messlehre
FR2489535B1 (fr) * 1980-09-03 1985-05-31 Commissariat Energie Atomique Dispositif de reconnaissance du profil d'un objet et application a la selection automatique de profils de cles
DE3044611A1 (de) * 1980-11-27 1982-11-25 Webb Service GmbH, 6000 Frankfurt Verfahren und vorrichtung zur erkennung von querschnittsprofilen von objekten
US4575637A (en) * 1983-07-28 1986-03-11 Polaroid Corporation Part positioning system employing a mask and photodetector array
DE3422988A1 (de) * 1984-06-22 1986-01-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren und vorrichtung zum messen der querkontraktion einer laenglichen probe
US5164995A (en) * 1989-11-27 1992-11-17 General Motors Corporation Signature analysis apparatus
DE4002293C2 (de) * 1990-01-26 1994-09-08 Schenck Ag Carl Vorrichtung zur Messung von Verformungen einer Probe in einer Prüfmaschine
US5130556A (en) * 1990-11-07 1992-07-14 Eaton Corporation Photoelectric fiber thickness and edge position sensor
US5383021A (en) * 1993-04-19 1995-01-17 Mectron Engineering Company Optical part inspection system
US5646724A (en) * 1995-08-18 1997-07-08 Candid Logic, Inc. Threaded parts inspection device
AU4501696A (en) * 1995-12-05 1997-06-27 Sherikon, Inc. High speed opto-electronic gage and method for gaging
US6175638B1 (en) * 1996-11-29 2001-01-16 Vladislav Yanovsky Shadow image acquisition device
US6185311B1 (en) * 1997-08-18 2001-02-06 Vladislav Yanovsky Key imaging system
JP2001525252A (ja) * 1997-11-24 2001-12-11 スバンテ ブジョルク アーベー 顆粒を選別する構成と方法
US6046462A (en) * 1997-12-16 2000-04-04 Eastman Kodak Company Method and apparatus for determining orientation of parts resting on a flat surface
US5955740A (en) * 1997-12-16 1999-09-21 Eastman Kodak Company Inspection method and apparatus for determining the side-up orientation of an object resting on a flat surface
EP1397961B1 (de) * 2002-09-11 2006-06-28 Hauni Maschinenbau AG Verfahren und Vorrichtung zum Messen der Länge und des Durchmessers von Filterstäben
FR2887061B1 (fr) * 2005-06-08 2007-08-17 Sagem Procede d'analyse d'une presence dans un espace
US9101990B2 (en) 2006-01-23 2015-08-11 Hy-Ko Products Key duplication machine
EP1976656B1 (en) 2006-01-23 2014-10-29 Hy-Ko Products Company Key duplication machine
US8644619B2 (en) 2009-05-01 2014-02-04 Hy-Ko Products Company Key blank identification system with groove scanning
EP2424690A4 (en) 2009-05-01 2013-11-27 Hy Ko Products KEY ROLL IDENTIFICATION SYSTEM WITH BART ANALYSIS
WO2017024043A1 (en) 2015-08-03 2017-02-09 Hy-Ko Products Company High security key scanning system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3604940A (en) * 1969-08-04 1971-09-14 Laser Systems Corp Radiant energy inspection system for rotating objects
US3830572A (en) * 1971-05-03 1974-08-20 Quantum Sensing Inc Optical sensor system
GB1379473A (en) * 1972-03-04 1975-01-02 Sensors Inc Inspection methods apparatus and systems
JPS5737806B2 (ja) * 1972-12-27 1982-08-12
SE380342B (sv) * 1973-02-14 1975-11-03 Lasergruppen Konsult Ab Forfarande och anordning for metning av ett metobjekts diameter, orundhet och lege
US3900738A (en) * 1973-05-23 1975-08-19 Lockheed Missiles Space Non-contact measuring gauge
US3989386A (en) * 1975-01-15 1976-11-02 Gte Sylvania Incorporated Automated inspection apparatus and method
US3992107A (en) * 1975-08-27 1976-11-16 Union Carbide Corporation Automatic flat width control

Also Published As

Publication number Publication date
CH613278A5 (ja) 1979-09-14
FR2350579A1 (fr) 1977-12-02
IT1115299B (it) 1986-02-03
SE7705252L (sv) 1977-11-08
DE2620240A1 (de) 1977-11-24
US4171161A (en) 1979-10-16

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