JPS52120761A - Exposure unit - Google Patents
Exposure unitInfo
- Publication number
- JPS52120761A JPS52120761A JP3718376A JP3718376A JPS52120761A JP S52120761 A JPS52120761 A JP S52120761A JP 3718376 A JP3718376 A JP 3718376A JP 3718376 A JP3718376 A JP 3718376A JP S52120761 A JPS52120761 A JP S52120761A
- Authority
- JP
- Japan
- Prior art keywords
- exposure unit
- unit
- incorporating
- easy adjustment
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To secure easy adjustment of the unit by incorporating the standard sample into the unit or sample holder.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3718376A JPS52120761A (en) | 1976-04-05 | 1976-04-05 | Exposure unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3718376A JPS52120761A (en) | 1976-04-05 | 1976-04-05 | Exposure unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS52120761A true JPS52120761A (en) | 1977-10-11 |
Family
ID=12490465
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3718376A Pending JPS52120761A (en) | 1976-04-05 | 1976-04-05 | Exposure unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS52120761A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58163138A (en) * | 1982-03-23 | 1983-09-27 | Fujitsu Ltd | Scanning type electron microscope |
JP2005038641A (en) * | 2003-07-16 | 2005-02-10 | Jeol Ltd | Charged particle beam device equipped with aberration control unit |
-
1976
- 1976-04-05 JP JP3718376A patent/JPS52120761A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58163138A (en) * | 1982-03-23 | 1983-09-27 | Fujitsu Ltd | Scanning type electron microscope |
JP2005038641A (en) * | 2003-07-16 | 2005-02-10 | Jeol Ltd | Charged particle beam device equipped with aberration control unit |
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