JPS52106274A - Non-destructive screening method of glass diode and its equipment - Google Patents

Non-destructive screening method of glass diode and its equipment

Info

Publication number
JPS52106274A
JPS52106274A JP2210776A JP2210776A JPS52106274A JP S52106274 A JPS52106274 A JP S52106274A JP 2210776 A JP2210776 A JP 2210776A JP 2210776 A JP2210776 A JP 2210776A JP S52106274 A JPS52106274 A JP S52106274A
Authority
JP
Japan
Prior art keywords
equipment
screening method
glass diode
destructive
destructive screening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2210776A
Other languages
English (en)
Japanese (ja)
Other versions
JPS545268B2 (enExample
Inventor
Masanori Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2210776A priority Critical patent/JPS52106274A/ja
Priority to US05/773,173 priority patent/US4125806A/en
Publication of JPS52106274A publication Critical patent/JPS52106274A/ja
Publication of JPS545268B2 publication Critical patent/JPS545268B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/265—Contactless testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2210776A 1976-03-03 1976-03-03 Non-destructive screening method of glass diode and its equipment Granted JPS52106274A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2210776A JPS52106274A (en) 1976-03-03 1976-03-03 Non-destructive screening method of glass diode and its equipment
US05/773,173 US4125806A (en) 1976-03-03 1977-03-01 Non-destructive screening device for glass diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2210776A JPS52106274A (en) 1976-03-03 1976-03-03 Non-destructive screening method of glass diode and its equipment

Publications (2)

Publication Number Publication Date
JPS52106274A true JPS52106274A (en) 1977-09-06
JPS545268B2 JPS545268B2 (enExample) 1979-03-15

Family

ID=12073655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2210776A Granted JPS52106274A (en) 1976-03-03 1976-03-03 Non-destructive screening method of glass diode and its equipment

Country Status (2)

Country Link
US (1) US4125806A (enExample)
JP (1) JPS52106274A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4184111A (en) * 1978-07-26 1980-01-15 Nasa Driver for solar cell I-V characteristic plots
FR2871812B1 (fr) * 2004-06-16 2008-09-05 Ion Beam Services Sa Implanteur ionique fonctionnant en mode plasma pulse
TWI370630B (en) * 2008-07-31 2012-08-11 Novatek Microelectronics Corp Wire signal receive apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3371276A (en) * 1964-12-28 1968-02-27 Rca Corp Apparatus responsive to radio frequency noise for non-destructively testing a reversely biased transistor for second breakdown
US3979672A (en) * 1975-09-12 1976-09-07 Rca Corporation Transistor testing circuit

Also Published As

Publication number Publication date
US4125806A (en) 1978-11-14
JPS545268B2 (enExample) 1979-03-15

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