JPS5196494U - - Google Patents
Info
- Publication number
- JPS5196494U JPS5196494U JP1478875U JP1478875U JPS5196494U JP S5196494 U JPS5196494 U JP S5196494U JP 1478875 U JP1478875 U JP 1478875U JP 1478875 U JP1478875 U JP 1478875U JP S5196494 U JPS5196494 U JP S5196494U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1975014788U JPS5349661Y2 (enrdf_load_stackoverflow) | 1975-01-31 | 1975-01-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1975014788U JPS5349661Y2 (enrdf_load_stackoverflow) | 1975-01-31 | 1975-01-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5196494U true JPS5196494U (enrdf_load_stackoverflow) | 1976-08-03 |
| JPS5349661Y2 JPS5349661Y2 (enrdf_load_stackoverflow) | 1978-11-29 |
Family
ID=28094135
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1975014788U Expired JPS5349661Y2 (enrdf_load_stackoverflow) | 1975-01-31 | 1975-01-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5349661Y2 (enrdf_load_stackoverflow) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5394553U (enrdf_load_stackoverflow) * | 1976-12-29 | 1978-08-01 | ||
| JPS62234859A (ja) * | 1986-03-24 | 1987-10-15 | ザ ウエルデイング インステイテユ−ト | 電子収集アッセンブリ |
| JP2013120650A (ja) * | 2011-12-06 | 2013-06-17 | Hitachi High-Technologies Corp | 走査電子顕微鏡および二次電子検出方法 |
| JP2018041676A (ja) * | 2016-09-09 | 2018-03-15 | 日本電子株式会社 | 電子検出装置及び電子顕微鏡装置 |
| US12255043B2 (en) | 2021-06-03 | 2025-03-18 | Jeol Ltd. | Scanning electron microscope and image generation method using scanning electron microscope |
-
1975
- 1975-01-31 JP JP1975014788U patent/JPS5349661Y2/ja not_active Expired
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5394553U (enrdf_load_stackoverflow) * | 1976-12-29 | 1978-08-01 | ||
| JPS62234859A (ja) * | 1986-03-24 | 1987-10-15 | ザ ウエルデイング インステイテユ−ト | 電子収集アッセンブリ |
| JP2013120650A (ja) * | 2011-12-06 | 2013-06-17 | Hitachi High-Technologies Corp | 走査電子顕微鏡および二次電子検出方法 |
| JP2018041676A (ja) * | 2016-09-09 | 2018-03-15 | 日本電子株式会社 | 電子検出装置及び電子顕微鏡装置 |
| US12255043B2 (en) | 2021-06-03 | 2025-03-18 | Jeol Ltd. | Scanning electron microscope and image generation method using scanning electron microscope |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5349661Y2 (enrdf_load_stackoverflow) | 1978-11-29 |