JPS5177260A - Ryushisenkenbikyo - Google Patents
RyushisenkenbikyoInfo
- Publication number
- JPS5177260A JPS5177260A JP50103896A JP10389675A JPS5177260A JP S5177260 A JPS5177260 A JP S5177260A JP 50103896 A JP50103896 A JP 50103896A JP 10389675 A JP10389675 A JP 10389675A JP S5177260 A JPS5177260 A JP S5177260A
- Authority
- JP
- Japan
- Prior art keywords
- ryushisenkenbikyo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
- H01J37/265—Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Holo Graphy (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19742441288 DE2441288C2 (de) | 1974-08-27 | 1974-08-27 | Korpuskularstrahlmikroskop, insbesondere elektronenmikroskop, mit verstelleinrichtungen zur aenderung der lage des abzubildenen objekts oder des objektbildes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5177260A true JPS5177260A (en) | 1976-07-05 |
| JPH0250448B2 JPH0250448B2 (cg-RX-API-DMAC7.html) | 1990-11-02 |
Family
ID=5924340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50103896A Granted JPS5177260A (en) | 1974-08-27 | 1975-08-27 | Ryushisenkenbikyo |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3971936A (cg-RX-API-DMAC7.html) |
| JP (1) | JPS5177260A (cg-RX-API-DMAC7.html) |
| DE (1) | DE2441288C2 (cg-RX-API-DMAC7.html) |
| GB (1) | GB1525261A (cg-RX-API-DMAC7.html) |
| NL (1) | NL7510066A (cg-RX-API-DMAC7.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61109253A (ja) * | 1984-10-31 | 1986-05-27 | Shimadzu Corp | 電子線マイクロアナライザ |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3325855A1 (de) * | 1983-07-18 | 1985-01-31 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen | Einrichtung zum erzeugen eines signales entsprechend einem faltungsprodukt zweier funktionen |
| US4907287A (en) * | 1985-10-16 | 1990-03-06 | Hitachi, Ltd. | Image correction system for scanning electron microscope |
| JP2760786B2 (ja) * | 1987-03-18 | 1998-06-04 | 株式会社日立製作所 | 走査電子顕微鏡およびその試料台移動方法 |
| NL9100076A (nl) * | 1991-01-17 | 1992-08-17 | Philips Nv | Methode voor automatische uitlijning van een elektronenmicroscoop en een elektronenmicroscoop geschikt voor uitvoering van een dergelijke methode. |
| DE69606517T2 (de) * | 1995-10-03 | 2000-09-14 | Koninklijke Philips Electronics N.V., Eindhoven | Verfahren zum wiederaufbau eines bildes in einem korpuskularoptischen gerät |
| US6287870B1 (en) * | 1999-08-20 | 2001-09-11 | Robert A. Levine | Method and assembly for separating formed constituents from a liquid constituent in a complex biologic fluid sample |
| US7034296B2 (en) * | 2001-11-21 | 2006-04-25 | Hitachi High-Technologies Corporation | Method of forming a sample image and charged particle beam apparatus |
| DE10234404B4 (de) * | 2002-07-29 | 2021-10-14 | Leica Microsystems Cms Gmbh | Verfahren, Anordnung und Software zur Überwachung und Kontrolle eines Mikroskops |
| US6980011B1 (en) * | 2004-01-13 | 2005-12-27 | Altera Corporation | Method and apparatus for detecting electrical failures on a die through maximizing passive voltage contrast on its surface |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3700895A (en) * | 1969-08-14 | 1972-10-24 | Research Corp | Scatterhole camera and method for using same including the step of convoluting the image |
-
1974
- 1974-08-27 DE DE19742441288 patent/DE2441288C2/de not_active Expired
-
1975
- 1975-08-06 US US05/602,461 patent/US3971936A/en not_active Expired - Lifetime
- 1975-08-20 GB GB34553/75A patent/GB1525261A/en not_active Expired
- 1975-08-26 NL NL7510066A patent/NL7510066A/xx not_active Application Discontinuation
- 1975-08-27 JP JP50103896A patent/JPS5177260A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61109253A (ja) * | 1984-10-31 | 1986-05-27 | Shimadzu Corp | 電子線マイクロアナライザ |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0250448B2 (cg-RX-API-DMAC7.html) | 1990-11-02 |
| NL7510066A (nl) | 1976-03-02 |
| GB1525261A (en) | 1978-09-20 |
| US3971936A (en) | 1976-07-27 |
| DE2441288B1 (de) | 1976-03-11 |
| DE2441288C2 (de) | 1976-10-28 |