JPS5165956A - - Google Patents

Info

Publication number
JPS5165956A
JPS5165956A JP50127556A JP12755675A JPS5165956A JP S5165956 A JPS5165956 A JP S5165956A JP 50127556 A JP50127556 A JP 50127556A JP 12755675 A JP12755675 A JP 12755675A JP S5165956 A JPS5165956 A JP S5165956A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50127556A
Inventor
Haashufuerudo Tomasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BUROTSUKU ENG Inc
Block Engineering Inc
Original Assignee
BUROTSUKU ENG Inc
Block Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BUROTSUKU ENG Inc, Block Engineering Inc filed Critical BUROTSUKU ENG Inc
Publication of JPS5165956A publication Critical patent/JPS5165956A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G02B21/084—Condensers for incident illumination only having annular illumination around the objective

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
JP50127556A 1974-10-24 1975-10-24 Pending JPS5165956A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/517,504 US3999855A (en) 1974-10-24 1974-10-24 Illumination system

Publications (1)

Publication Number Publication Date
JPS5165956A true JPS5165956A (ja) 1976-06-08

Family

ID=24060082

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50127556A Pending JPS5165956A (ja) 1974-10-24 1975-10-24

Country Status (7)

Country Link
US (1) US3999855A (ja)
JP (1) JPS5165956A (ja)
AU (1) AU8581675A (ja)
DE (1) DE2546952A1 (ja)
FR (1) FR2289929A1 (ja)
GB (1) GB1492203A (ja)
NL (1) NL7512371A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58198762A (ja) * 1982-05-15 1983-11-18 Iseki & Co Ltd 粒状物の流下検出装置
JPS58185819U (ja) * 1982-06-02 1983-12-10 株式会社ニコン リングスリツト絞りを有する照明光源装置

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2357888A1 (fr) * 1976-04-01 1978-02-03 Cerberus Ag Detecteur de fumee
JPS55500589A (ja) * 1978-08-30 1980-09-04
FR2565689B1 (fr) * 1984-06-12 1987-11-20 Elf France Procede et dispositif pour la determination du point de trouble d'un gazole
US4893886A (en) * 1987-09-17 1990-01-16 American Telephone And Telegraph Company Non-destructive optical trap for biological particles and method of doing same
US4886357A (en) * 1988-09-06 1989-12-12 Harrick Nicolas J Internal reflection element with insensitive edges
US5747813A (en) * 1992-06-16 1998-05-05 Kla-Tencop. Corporation Broadband microspectro-reflectometer
US5486701A (en) * 1992-06-16 1996-01-23 Prometrix Corporation Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness
DE69418248T2 (de) * 1993-06-03 1999-10-14 Hamamatsu Photonics Kk Optisches Laser-Abtastsystem mit Axikon
DE69830598T2 (de) * 1997-01-31 2006-05-18 The Horticulture And Food Research Institute Of New Zealand Limited Optische vorrichtung und methode
US5982534A (en) * 1997-06-18 1999-11-09 The Regents Of The University Of California Specimen illumination apparatus with optical cavity for dark field illumination
US6438396B1 (en) 1998-11-05 2002-08-20 Cytometrics, Inc. Method and apparatus for providing high contrast imaging
JP2000250100A (ja) 1999-03-01 2000-09-14 Mitsutoyo Corp 光学測定機用照明装置
US6185051B1 (en) * 1999-06-23 2001-02-06 Read-Rite Corporation High numerical aperture optical focusing device for use in data storage systems
JP3783826B2 (ja) * 2000-01-17 2006-06-07 横河電機株式会社 バイオチップ読み取り装置
DE10222785B4 (de) * 2002-05-23 2004-12-16 Wendlandt, Erhard Verfahren und Vorrichtung zur Probenuntersuchung
US7330255B2 (en) * 2004-12-09 2008-02-12 University Of Chicago Total internal reflection fluorescence apparatus
US7538874B2 (en) * 2006-03-23 2009-05-26 Hach Company Measurement of light from a predefined scatter angle from particulate matter in a media
US9291562B2 (en) * 2011-11-15 2016-03-22 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Method and apparatus for tracking a particle, particularly a single molecule, in a sample
DE102011055367B4 (de) * 2011-11-15 2017-02-09 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zum Verfolgen einer Bewegung eines Partikels, insbesondere eines einzelnen Moleküls, in einer Probe
EP2720075B1 (en) * 2012-10-12 2017-11-29 Spectral Applied Research Inc. Total internal reflectance fluorescence (TIRF) microscopy across multiple wavelengths simultaneously
US9690085B2 (en) * 2014-01-30 2017-06-27 Olympus Corporation Microscope illumination apparatus, microscope, and microscope illumination method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3506360A (en) * 1967-10-30 1970-04-14 Gamrad Inc Turbidity indicator using superimposed converging light beams
US3700330A (en) * 1971-10-13 1972-10-24 Gen Motors Corp Electro-optical vehicle exhaust particulate monitor
US3850525A (en) * 1973-07-09 1974-11-26 Beckman Instruments Inc Simultaneous multiple measurements in laser photometers

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58198762A (ja) * 1982-05-15 1983-11-18 Iseki & Co Ltd 粒状物の流下検出装置
JPS58185819U (ja) * 1982-06-02 1983-12-10 株式会社ニコン リングスリツト絞りを有する照明光源装置

Also Published As

Publication number Publication date
GB1492203A (en) 1977-11-16
FR2289929B1 (ja) 1979-07-06
US3999855A (en) 1976-12-28
USB517504I5 (ja) 1976-03-09
DE2546952A1 (de) 1976-04-29
NL7512371A (nl) 1976-04-27
FR2289929A1 (fr) 1976-05-28
AU8581675A (en) 1977-04-21

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