JPS51146891A - Fluorescent x ray analyzing apparatus - Google Patents

Fluorescent x ray analyzing apparatus

Info

Publication number
JPS51146891A
JPS51146891A JP7047775A JP7047775A JPS51146891A JP S51146891 A JPS51146891 A JP S51146891A JP 7047775 A JP7047775 A JP 7047775A JP 7047775 A JP7047775 A JP 7047775A JP S51146891 A JPS51146891 A JP S51146891A
Authority
JP
Japan
Prior art keywords
fluorescent
analyzing apparatus
ray analyzing
ray
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7047775A
Other languages
Japanese (ja)
Inventor
Keizo Kono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7047775A priority Critical patent/JPS51146891A/en
Publication of JPS51146891A publication Critical patent/JPS51146891A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor
    • G01N23/20033Sample holders or supports therefor provided with temperature control or heating means

Abstract

PURPOSE:To reduce the dependence of the apparatus on temperature to such degree that there is no problem for practical use by keeping temperature in the radioactive ray or X-ray path constant through the medium of hearters.
JP7047775A 1975-06-11 1975-06-11 Fluorescent x ray analyzing apparatus Pending JPS51146891A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7047775A JPS51146891A (en) 1975-06-11 1975-06-11 Fluorescent x ray analyzing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7047775A JPS51146891A (en) 1975-06-11 1975-06-11 Fluorescent x ray analyzing apparatus

Publications (1)

Publication Number Publication Date
JPS51146891A true JPS51146891A (en) 1976-12-16

Family

ID=13432631

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7047775A Pending JPS51146891A (en) 1975-06-11 1975-06-11 Fluorescent x ray analyzing apparatus

Country Status (1)

Country Link
JP (1) JPS51146891A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5417897A (en) * 1977-06-22 1979-02-09 Kernforschungsz Karlsruhe Apparatus for measuring uranium or thorium in ore sample

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5417897A (en) * 1977-06-22 1979-02-09 Kernforschungsz Karlsruhe Apparatus for measuring uranium or thorium in ore sample

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