JPS5080155A - - Google Patents
Info
- Publication number
- JPS5080155A JPS5080155A JP12744874A JP12744874A JPS5080155A JP S5080155 A JPS5080155 A JP S5080155A JP 12744874 A JP12744874 A JP 12744874A JP 12744874 A JP12744874 A JP 12744874A JP S5080155 A JPS5080155 A JP S5080155A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19732355185 DE2355185C2 (de) | 1973-11-05 | 1973-11-05 | Anordnung zur Dickenmessung von Gegenständen unter Verwendung von Laserstrahlen |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5080155A true JPS5080155A (enrdf_load_stackoverflow) | 1975-06-30 |
JPS5428090B2 JPS5428090B2 (enrdf_load_stackoverflow) | 1979-09-13 |
Family
ID=5897224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12744874A Expired JPS5428090B2 (enrdf_load_stackoverflow) | 1973-11-05 | 1974-11-05 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS5428090B2 (enrdf_load_stackoverflow) |
DE (1) | DE2355185C2 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5647701A (en) * | 1979-09-27 | 1981-04-30 | Canon Inc | Detector for incident location of light flux |
JPS626106A (ja) * | 1985-07-03 | 1987-01-13 | Kazuo Shimada | 厚さ測定方法および測定装置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3204086A1 (de) * | 1982-02-06 | 1983-08-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Vorrichtung zur automatischen optischen beschaffenheitspruefung |
DE3774765D1 (de) * | 1986-06-04 | 1992-01-09 | Philips Nv | Optische messanordnung des abstands zwischen einer oberflaeche und einer bezugsebene. |
DE3728705A1 (de) * | 1987-08-28 | 1989-03-09 | Agfa Gevaert Ag | Vorrichtung zur ueberpruefung von beschichteten und unbeschichteten folien |
DE3728704A1 (de) * | 1987-08-28 | 1989-03-09 | Agfa Gevaert Ag | Vorrichtung zur bestimmung der dicke von schichttraegern |
-
1973
- 1973-11-05 DE DE19732355185 patent/DE2355185C2/de not_active Expired
-
1974
- 1974-11-05 JP JP12744874A patent/JPS5428090B2/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5647701A (en) * | 1979-09-27 | 1981-04-30 | Canon Inc | Detector for incident location of light flux |
JPS626106A (ja) * | 1985-07-03 | 1987-01-13 | Kazuo Shimada | 厚さ測定方法および測定装置 |
Also Published As
Publication number | Publication date |
---|---|
DE2355185C2 (de) | 1975-05-22 |
JPS5428090B2 (enrdf_load_stackoverflow) | 1979-09-13 |
DE2355185B1 (de) | 1974-10-10 |