JPS506364A - - Google Patents

Info

Publication number
JPS506364A
JPS506364A JP48053986A JP5398673A JPS506364A JP S506364 A JPS506364 A JP S506364A JP 48053986 A JP48053986 A JP 48053986A JP 5398673 A JP5398673 A JP 5398673A JP S506364 A JPS506364 A JP S506364A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48053986A
Other versions
JPS5338937B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5398673A priority Critical patent/JPS5338937B2/ja
Publication of JPS506364A publication Critical patent/JPS506364A/ja
Publication of JPS5338937B2 publication Critical patent/JPS5338937B2/ja
Expired legal-status Critical Current

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Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP5398673A 1973-05-15 1973-05-15 Expired JPS5338937B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5398673A JPS5338937B2 (ja) 1973-05-15 1973-05-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5398673A JPS5338937B2 (ja) 1973-05-15 1973-05-15

Publications (2)

Publication Number Publication Date
JPS506364A true JPS506364A (ja) 1975-01-23
JPS5338937B2 JPS5338937B2 (ja) 1978-10-18

Family

ID=12957929

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5398673A Expired JPS5338937B2 (ja) 1973-05-15 1973-05-15

Country Status (1)

Country Link
JP (1) JPS5338937B2 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01316605A (ja) * 1988-04-06 1989-12-21 Aerospat Soc Natl Ind 物質の元素の容積体の単位体積当りの質量測定装置
JPH06323980A (ja) * 1993-05-13 1994-11-25 Mitsui Constr Co Ltd 盤質計測方法及び盤質計測装置
JP2008139302A (ja) * 2006-11-13 2008-06-19 Thermo Fisher Scientific Inc ガンマ後方散乱による密度測定
JP2017101967A (ja) * 2015-11-30 2017-06-08 一般財団法人電力中央研究所 非破壊検査方法および装置
JP2019132632A (ja) * 2018-01-30 2019-08-08 ソイルアンドロックエンジニアリング株式会社 密度測定装置および密度測定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3270203A (en) * 1962-10-08 1966-08-30 Nuclear Chicago Corp Industrial-process-type measurements employing gamma-ray backscattering

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3270203A (en) * 1962-10-08 1966-08-30 Nuclear Chicago Corp Industrial-process-type measurements employing gamma-ray backscattering

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01316605A (ja) * 1988-04-06 1989-12-21 Aerospat Soc Natl Ind 物質の元素の容積体の単位体積当りの質量測定装置
JPH06323980A (ja) * 1993-05-13 1994-11-25 Mitsui Constr Co Ltd 盤質計測方法及び盤質計測装置
JP2008139302A (ja) * 2006-11-13 2008-06-19 Thermo Fisher Scientific Inc ガンマ後方散乱による密度測定
JP4624399B2 (ja) * 2006-11-13 2011-02-02 サーモ フィッシャー サイエンティフィック インコーポレーテッド ガンマ後方散乱による密度測定
JP2017101967A (ja) * 2015-11-30 2017-06-08 一般財団法人電力中央研究所 非破壊検査方法および装置
JP2019132632A (ja) * 2018-01-30 2019-08-08 ソイルアンドロックエンジニアリング株式会社 密度測定装置および密度測定方法

Also Published As

Publication number Publication date
JPS5338937B2 (ja) 1978-10-18

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