JPS5062389A - - Google Patents

Info

Publication number
JPS5062389A
JPS5062389A JP48109264A JP10926473A JPS5062389A JP S5062389 A JPS5062389 A JP S5062389A JP 48109264 A JP48109264 A JP 48109264A JP 10926473 A JP10926473 A JP 10926473A JP S5062389 A JPS5062389 A JP S5062389A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48109264A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP48109264A priority Critical patent/JPS5062389A/ja
Publication of JPS5062389A publication Critical patent/JPS5062389A/ja
Pending legal-status Critical Current

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  • Light Receiving Elements (AREA)
JP48109264A 1973-10-01 1973-10-01 Pending JPS5062389A (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP48109264A JPS5062389A (de) 1973-10-01 1973-10-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48109264A JPS5062389A (de) 1973-10-01 1973-10-01

Publications (1)

Publication Number Publication Date
JPS5062389A true JPS5062389A (de) 1975-05-28

Family

ID=14505750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48109264A Pending JPS5062389A (de) 1973-10-01 1973-10-01

Country Status (1)

Country Link
JP (1) JPS5062389A (de)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55127082A (en) * 1979-03-23 1980-10-01 Nec Corp Bias voltage generating circuit of avalanche photodiode
JPS57188887A (en) * 1981-05-15 1982-11-19 Nec Corp Avalanche photodiode package
WO2020121858A1 (ja) * 2018-12-12 2020-06-18 浜松ホトニクス株式会社 光検出装置及び光検出装置の製造方法
WO2020121857A1 (ja) * 2018-12-12 2020-06-18 浜松ホトニクス株式会社 光検出装置及び光検出装置の製造方法
CN113167640A (zh) * 2018-12-12 2021-07-23 浜松光子学株式会社 光检测装置
US11513002B2 (en) 2018-12-12 2022-11-29 Hamamatsu Photonics K.K. Light detection device having temperature compensated gain in avalanche photodiode
US11901379B2 (en) 2018-12-12 2024-02-13 Hamamatsu Photonics K.K. Photodetector
US12113088B2 (en) 2018-12-12 2024-10-08 Hamamatsu Photonics K.K. Light detection device

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55127082A (en) * 1979-03-23 1980-10-01 Nec Corp Bias voltage generating circuit of avalanche photodiode
JPS57188887A (en) * 1981-05-15 1982-11-19 Nec Corp Avalanche photodiode package
WO2020121858A1 (ja) * 2018-12-12 2020-06-18 浜松ホトニクス株式会社 光検出装置及び光検出装置の製造方法
WO2020121857A1 (ja) * 2018-12-12 2020-06-18 浜松ホトニクス株式会社 光検出装置及び光検出装置の製造方法
CN113167642A (zh) * 2018-12-12 2021-07-23 浜松光子学株式会社 光检测装置和光检测装置的制造方法
CN113167643A (zh) * 2018-12-12 2021-07-23 浜松光子学株式会社 光检测装置及光检测装置的制造方法
CN113167640A (zh) * 2018-12-12 2021-07-23 浜松光子学株式会社 光检测装置
JPWO2020121857A1 (ja) * 2018-12-12 2021-11-04 浜松ホトニクス株式会社 光検出装置及び光検出装置の製造方法
JPWO2020121858A1 (ja) * 2018-12-12 2021-11-04 浜松ホトニクス株式会社 光検出装置及び光検出装置の製造方法
US11513002B2 (en) 2018-12-12 2022-11-29 Hamamatsu Photonics K.K. Light detection device having temperature compensated gain in avalanche photodiode
US11561131B2 (en) 2018-12-12 2023-01-24 Hamamatsu Photonics K.K. Determination method and light detection device
US11901379B2 (en) 2018-12-12 2024-02-13 Hamamatsu Photonics K.K. Photodetector
US11927478B2 (en) 2018-12-12 2024-03-12 Hamamatsu Photonics K.K. Light detection device
CN113167643B (zh) * 2018-12-12 2024-05-28 浜松光子学株式会社 光检测装置及光检测装置的制造方法
US12080822B2 (en) 2018-12-12 2024-09-03 Hamamatsu Photonics K.K. Photodetector and method for manufacturing photodetector
US12113088B2 (en) 2018-12-12 2024-10-08 Hamamatsu Photonics K.K. Light detection device

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