JPS5044882A - - Google Patents

Info

Publication number
JPS5044882A
JPS5044882A JP49082677A JP8267774A JPS5044882A JP S5044882 A JPS5044882 A JP S5044882A JP 49082677 A JP49082677 A JP 49082677A JP 8267774 A JP8267774 A JP 8267774A JP S5044882 A JPS5044882 A JP S5044882A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP49082677A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5044882A publication Critical patent/JPS5044882A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21FPROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00Shielding characterised by the composition of the materials
    • G21F1/02Selection of uniform shielding materials
    • G21F1/08Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Metallurgy (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP49082677A 1973-07-18 1974-07-18 Pending JPS5044882A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19732336652 DE2336652A1 (de) 1973-07-18 1973-07-18 Schichtsystem zur absorption von roentgenstrahlen

Publications (1)

Publication Number Publication Date
JPS5044882A true JPS5044882A (ja) 1975-04-22

Family

ID=5887354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49082677A Pending JPS5044882A (ja) 1973-07-18 1974-07-18

Country Status (9)

Country Link
US (1) US3925678A (ja)
JP (1) JPS5044882A (ja)
BE (1) BE817811A (ja)
DE (1) DE2336652A1 (ja)
DK (1) DK385174A (ja)
FR (1) FR2238218B3 (ja)
IT (1) IT1017127B (ja)
LU (1) LU70538A1 (ja)
NL (1) NL7409479A (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
DE3583436D1 (de) * 1984-10-05 1991-08-14 Kawasaki Steel Co Verfahren zur bestimmung der dicke und der zusammensetzung eines legierungsfilms.
US4821301A (en) * 1986-02-28 1989-04-11 Duke University X-ray reflection method and apparatus for chemical analysis of thin surface layers
US6806093B2 (en) * 2000-07-18 2004-10-19 Uop Llc Process of parallel sample preparation
WO2002006792A2 (en) * 2000-07-18 2002-01-24 Uop Llc Process of parallel sample preparation
US6677162B1 (en) 2000-07-18 2004-01-13 Uop Llc Process of parallel sample preparation
US7341414B2 (en) * 2005-05-02 2008-03-11 Cummins Inc. Fastener and method for reducing stress failure in an engine component
DE102011109822B4 (de) * 2011-08-09 2019-10-10 Ketek Gmbh Vorrichtung für einen Strahlungsdetektor sowie Strahlungsdetektor mit der Vorrichtung
EP4184153A4 (en) * 2020-07-14 2024-04-17 Shimadzu Corporation X-RAY FLUORESCENCE ANALYSER

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644736A (en) * 1968-11-05 1972-02-22 Giken Kogyo Kk Back-scattering absorber materials for gamma-rays

Also Published As

Publication number Publication date
FR2238218B3 (ja) 1977-05-06
NL7409479A (nl) 1975-01-21
DE2336652A1 (de) 1975-01-30
US3925678A (en) 1975-12-09
LU70538A1 (ja) 1974-11-28
DK385174A (ja) 1975-03-10
IT1017127B (it) 1977-07-20
BE817811A (fr) 1974-11-18
FR2238218A1 (ja) 1975-02-14

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