JPS5042652U - - Google Patents
Info
- Publication number
- JPS5042652U JPS5042652U JP9623673U JP9623673U JPS5042652U JP S5042652 U JPS5042652 U JP S5042652U JP 9623673 U JP9623673 U JP 9623673U JP 9623673 U JP9623673 U JP 9623673U JP S5042652 U JPS5042652 U JP S5042652U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9623673U JPS534768Y2 (enExample) | 1973-08-16 | 1973-08-16 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9623673U JPS534768Y2 (enExample) | 1973-08-16 | 1973-08-16 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5042652U true JPS5042652U (enExample) | 1975-04-30 |
| JPS534768Y2 JPS534768Y2 (enExample) | 1978-02-06 |
Family
ID=28293718
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9623673U Expired JPS534768Y2 (enExample) | 1973-08-16 | 1973-08-16 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS534768Y2 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6166353A (ja) * | 1984-09-07 | 1986-04-05 | Jeol Ltd | 走査像の補正方法 |
| JPH052876U (ja) * | 1991-03-22 | 1993-01-19 | 三菱電機株式会社 | 電子機器のモジユール引き抜き工具 |
| JP2009122055A (ja) * | 2007-11-19 | 2009-06-04 | Hitachi High-Technologies Corp | 半導体外観検査装置および検査方法 |
-
1973
- 1973-08-16 JP JP9623673U patent/JPS534768Y2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6166353A (ja) * | 1984-09-07 | 1986-04-05 | Jeol Ltd | 走査像の補正方法 |
| JPH052876U (ja) * | 1991-03-22 | 1993-01-19 | 三菱電機株式会社 | 電子機器のモジユール引き抜き工具 |
| JP2009122055A (ja) * | 2007-11-19 | 2009-06-04 | Hitachi High-Technologies Corp | 半導体外観検査装置および検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS534768Y2 (enExample) | 1978-02-06 |