JPS5040066A - - Google Patents
Info
- Publication number
- JPS5040066A JPS5040066A JP48090881A JP9088173A JPS5040066A JP S5040066 A JPS5040066 A JP S5040066A JP 48090881 A JP48090881 A JP 48090881A JP 9088173 A JP9088173 A JP 9088173A JP S5040066 A JPS5040066 A JP S5040066A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48090881A JPS5040066A (ja) | 1973-08-15 | 1973-08-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48090881A JPS5040066A (ja) | 1973-08-15 | 1973-08-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5040066A true JPS5040066A (ja) | 1975-04-12 |
Family
ID=14010782
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48090881A Pending JPS5040066A (ja) | 1973-08-15 | 1973-08-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5040066A (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5481065A (en) * | 1977-12-12 | 1979-06-28 | Jeol Ltd | Sample analyzer of scanning electron microscope |
| JPS63313043A (ja) * | 1987-06-15 | 1988-12-21 | Jeol Ltd | 平均原子番号によるバックグラウンド推定法 |
| JPS6457157A (en) * | 1987-08-27 | 1989-03-03 | Jeol Ltd | Simple quantitative analysis method with wavelength dispersion type x-ray spectroscope |
| JP2018041676A (ja) * | 2016-09-09 | 2018-03-15 | 日本電子株式会社 | 電子検出装置及び電子顕微鏡装置 |
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1973
- 1973-08-15 JP JP48090881A patent/JPS5040066A/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5481065A (en) * | 1977-12-12 | 1979-06-28 | Jeol Ltd | Sample analyzer of scanning electron microscope |
| JPS63313043A (ja) * | 1987-06-15 | 1988-12-21 | Jeol Ltd | 平均原子番号によるバックグラウンド推定法 |
| JPS6457157A (en) * | 1987-08-27 | 1989-03-03 | Jeol Ltd | Simple quantitative analysis method with wavelength dispersion type x-ray spectroscope |
| JP2018041676A (ja) * | 2016-09-09 | 2018-03-15 | 日本電子株式会社 | 電子検出装置及び電子顕微鏡装置 |