JPS5036190B1 - - Google Patents

Info

Publication number
JPS5036190B1
JPS5036190B1 JP44019454A JP1945469A JPS5036190B1 JP S5036190 B1 JPS5036190 B1 JP S5036190B1 JP 44019454 A JP44019454 A JP 44019454A JP 1945469 A JP1945469 A JP 1945469A JP S5036190 B1 JPS5036190 B1 JP S5036190B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP44019454A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5036190B1 publication Critical patent/JPS5036190B1/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02Vessels; Containers; Shields associated therewith; Vacuum locks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP44019454A 1968-03-14 1969-03-14 Pending JPS5036190B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US71627468A 1968-03-14 1968-03-14

Publications (1)

Publication Number Publication Date
JPS5036190B1 true JPS5036190B1 (ja) 1975-11-21

Family

ID=24877402

Family Applications (1)

Application Number Title Priority Date Filing Date
JP44019454A Pending JPS5036190B1 (ja) 1968-03-14 1969-03-14

Country Status (3)

Country Link
US (1) US3555272A (ja)
JP (1) JPS5036190B1 (ja)
DE (1) DE1912533A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5215078U (ja) * 1975-07-21 1977-02-02

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4005291A (en) * 1972-01-04 1977-01-25 Massachusetts Institute Of Technology Ionization method for mass spectrometry
US3920987A (en) * 1972-09-14 1975-11-18 Stanford Research Inst Method and system for detecting explosives
US3992632A (en) * 1973-08-27 1976-11-16 Hewlett-Packard Company Multiconfiguration ionization source
USRE30171E (en) * 1973-08-27 1979-12-18 Hewlett-Packard Company Multiconfiguration ionization source
US3886365A (en) * 1973-08-27 1975-05-27 Hewlett Packard Co Multiconfiguration ionization source
SE392646B (sv) * 1975-04-03 1977-04-04 Lkb Produkter Ab Jonkella
GB1571799A (en) * 1975-12-15 1980-07-16 Secr Defence Detection of polar vapours
CA1076714A (en) * 1976-01-20 1980-04-29 Donald F. Hunt Positive and negative ion recording system for mass spectrometer
US4066894A (en) * 1976-01-20 1978-01-03 University Of Virginia Positive and negative ion recording system for mass spectrometer
DE2737852C2 (de) * 1977-08-23 1982-04-22 Bruker - Franzen Analytik GmbH, 2800 Bremen Ionenquellen zur chemischen Ionisierung
US4321467A (en) * 1980-06-04 1982-03-23 Sri International Flow discharge ion source
US4551624A (en) * 1983-09-23 1985-11-05 Allied Corporation Ion mobility spectrometer system with improved specificity
AT404882B (de) * 1987-05-14 1999-03-25 V & F Analyse & Messtechnik Verfahren und einrichtung zur konzentrationsmessung an gasgemischen
US5192865A (en) * 1992-01-14 1993-03-09 Cetac Technologies Inc. Atmospheric pressure afterglow ionization system and method of use, for mass spectrometer sample analysis systems
JP3718971B2 (ja) * 1997-09-19 2005-11-24 株式会社島津製作所 質量分析計
US7109476B2 (en) 1999-02-09 2006-09-19 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US6211516B1 (en) * 1999-02-09 2001-04-03 Syagen Technology Photoionization mass spectrometer
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US6630664B1 (en) 1999-02-09 2003-10-07 Syagen Technology Atmospheric pressure photoionizer for mass spectrometry
US6737642B2 (en) 2002-03-18 2004-05-18 Syagen Technology High dynamic range analog-to-digital converter
DE102005044307B4 (de) * 2005-09-16 2008-04-17 Bruker Daltonik Gmbh Ionisierung desorbierter Moleküle
US7858933B2 (en) * 2006-03-07 2010-12-28 Shimadzu Corporation Mass spectrometer
US7714277B2 (en) * 2006-07-20 2010-05-11 Owlstone Nanotech, Inc. Smart FAIMS sensor
US8334505B2 (en) 2007-10-10 2012-12-18 Mks Instruments, Inc. Chemical ionization reaction or proton transfer reaction mass spectrometry
WO2019217541A1 (en) * 2018-05-11 2019-11-14 Leco Corporation Two-stage ion source comprising closed and open ion volumes

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3254209A (en) * 1962-11-29 1966-05-31 Gen Dynamics Corp Method and apparatus for increasing the ionization of impurity ions in a mass spectrometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5215078U (ja) * 1975-07-21 1977-02-02

Also Published As

Publication number Publication date
US3555272A (en) 1971-01-12
DE1912533A1 (de) 1969-11-20

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