JPS5019496A - - Google Patents

Info

Publication number
JPS5019496A
JPS5019496A JP48070298A JP7029873A JPS5019496A JP S5019496 A JPS5019496 A JP S5019496A JP 48070298 A JP48070298 A JP 48070298A JP 7029873 A JP7029873 A JP 7029873A JP S5019496 A JPS5019496 A JP S5019496A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48070298A
Other languages
Japanese (ja)
Other versions
JPS5412079B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7029873A priority Critical patent/JPS5412079B2/ja
Publication of JPS5019496A publication Critical patent/JPS5019496A/ja
Publication of JPS5412079B2 publication Critical patent/JPS5412079B2/ja
Expired legal-status Critical Current

Links

JP7029873A 1973-06-20 1973-06-20 Expired JPS5412079B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7029873A JPS5412079B2 (en) 1973-06-20 1973-06-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7029873A JPS5412079B2 (en) 1973-06-20 1973-06-20

Publications (2)

Publication Number Publication Date
JPS5019496A true JPS5019496A (en) 1975-02-28
JPS5412079B2 JPS5412079B2 (en) 1979-05-19

Family

ID=13427399

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7029873A Expired JPS5412079B2 (en) 1973-06-20 1973-06-20

Country Status (1)

Country Link
JP (1) JPS5412079B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS544828A (en) * 1977-06-14 1979-01-13 Nippon Electro Plating Method of adjusting plating thickness in automatic continuous plating and measuring device therefor
US6019886A (en) * 1996-09-17 2000-02-01 Texas Instruments Incorporated Comparator for monitoring the deposition of an electrically conductive material on a leadframe to warn of improper operation of a leadframe electroplating process
CN112958116A (en) * 2021-02-22 2021-06-15 西南大学 Bi2O2.33-CdS composite photocatalyst and preparation process thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS544828A (en) * 1977-06-14 1979-01-13 Nippon Electro Plating Method of adjusting plating thickness in automatic continuous plating and measuring device therefor
JPS6160159B2 (en) * 1977-06-14 1986-12-19 Nippon Erekutoropureiteingu Enjinyaazu Kk
US6019886A (en) * 1996-09-17 2000-02-01 Texas Instruments Incorporated Comparator for monitoring the deposition of an electrically conductive material on a leadframe to warn of improper operation of a leadframe electroplating process
CN112958116A (en) * 2021-02-22 2021-06-15 西南大学 Bi2O2.33-CdS composite photocatalyst and preparation process thereof
CN112958116B (en) * 2021-02-22 2021-11-19 西南大学 Bi2O2.33-CdS composite photocatalyst and preparation process thereof

Also Published As

Publication number Publication date
JPS5412079B2 (en) 1979-05-19

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