JPS5011084A - - Google Patents

Info

Publication number
JPS5011084A
JPS5011084A JP48059787A JP5978773A JPS5011084A JP S5011084 A JPS5011084 A JP S5011084A JP 48059787 A JP48059787 A JP 48059787A JP 5978773 A JP5978773 A JP 5978773A JP S5011084 A JPS5011084 A JP S5011084A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48059787A
Other languages
Japanese (ja)
Other versions
JPS5514379B2 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5978773A priority Critical patent/JPS5514379B2/ja
Priority to US473898A priority patent/US3914605A/en
Publication of JPS5011084A publication Critical patent/JPS5011084A/ja
Publication of JPS5514379B2 publication Critical patent/JPS5514379B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G01N2223/0568—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction spectro-diffractometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/418—Imaging electron microscope

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP5978773A 1973-05-30 1973-05-30 Expired JPS5514379B2 (https=)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP5978773A JPS5514379B2 (https=) 1973-05-30 1973-05-30
US473898A US3914605A (en) 1973-05-30 1974-05-28 X-ray spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5978773A JPS5514379B2 (https=) 1973-05-30 1973-05-30

Publications (2)

Publication Number Publication Date
JPS5011084A true JPS5011084A (https=) 1975-02-04
JPS5514379B2 JPS5514379B2 (https=) 1980-04-16

Family

ID=13123335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5978773A Expired JPS5514379B2 (https=) 1973-05-30 1973-05-30

Country Status (2)

Country Link
US (1) US3914605A (https=)
JP (1) JPS5514379B2 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4365156A (en) * 1980-12-23 1982-12-21 Bell Telephone Laboratories, Incorporated Tunable θ-2θ device
US4398823A (en) * 1981-06-01 1983-08-16 Baker Manufacturing Company Extended range monochromator
DE3125803A1 (de) * 1981-06-30 1983-01-13 Siemens AG, 1000 Berlin und 8000 München Kristall-roentgen-sequenzspektrometer
NL8300420A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen analyse apparaat.
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4882780A (en) * 1983-11-04 1989-11-21 University Of Southern California Scanning monochromator crystal and related method
FR2600417B1 (fr) * 1986-06-19 1990-01-12 Centre Nat Rech Scient Spectrometrie de rayons x a focalisation par cristal courbe et a chambre d'emission de rayons x polyvalente
JPS6417369A (en) * 1987-07-10 1989-01-20 Jeol Ltd Spectrum display unit in x-ray microanalyzer and the like
JPH0238850A (ja) * 1988-07-28 1990-02-08 Jeol Ltd Ｘ線分光器を用いた定性分析方法
JP2766199B2 (ja) * 1994-10-04 1998-06-18 株式会社神戸製鋼所 Ｘ線分析装置
JP2002329473A (ja) * 2001-02-27 2002-11-15 Jeol Ltd Ｘ線分光器を備えた透過型電子顕微鏡
WO2017117197A1 (en) * 2015-12-28 2017-07-06 University Of Washington Methods for aligning a spectrometer
EP4650760A3 (en) * 2019-10-21 2026-01-21 Easyxafs, LLC Spectrometer
TWI763536B (zh) 2021-06-09 2022-05-01 川湖科技股份有限公司 滑軌總成

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL74667C (https=) * 1949-04-19

Also Published As

Publication number Publication date
JPS5514379B2 (https=) 1980-04-16
US3914605A (en) 1975-10-21

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