JPS4960651U - - Google Patents
Info
- Publication number
- JPS4960651U JPS4960651U JP10381072U JP10381072U JPS4960651U JP S4960651 U JPS4960651 U JP S4960651U JP 10381072 U JP10381072 U JP 10381072U JP 10381072 U JP10381072 U JP 10381072U JP S4960651 U JPS4960651 U JP S4960651U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1972103810U JPS5622607Y2 (cs) | 1972-09-06 | 1972-09-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1972103810U JPS5622607Y2 (cs) | 1972-09-06 | 1972-09-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4960651U true JPS4960651U (cs) | 1974-05-28 |
| JPS5622607Y2 JPS5622607Y2 (cs) | 1981-05-27 |
Family
ID=28315001
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1972103810U Expired JPS5622607Y2 (cs) | 1972-09-06 | 1972-09-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5622607Y2 (cs) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5358769A (en) * | 1976-11-08 | 1978-05-26 | Fujitsu Ltd | Ion injector |
| JPS5497357A (en) * | 1978-01-18 | 1979-08-01 | Jeol Ltd | Detector for sample irradiation current of electron microscope or the like |
| JP2007206030A (ja) * | 2006-02-06 | 2007-08-16 | Ricoh Co Ltd | 感光体性能測定装置および画像形成装置 |
| JP2008116467A (ja) * | 2007-12-03 | 2008-05-22 | Ulvac Japan Ltd | 表面分析装置、及び表面分析方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1985005492A1 (en) * | 1984-05-23 | 1985-12-05 | Sony Corporation | Apparatus for generating electron beam |
-
1972
- 1972-09-06 JP JP1972103810U patent/JPS5622607Y2/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5358769A (en) * | 1976-11-08 | 1978-05-26 | Fujitsu Ltd | Ion injector |
| JPS5497357A (en) * | 1978-01-18 | 1979-08-01 | Jeol Ltd | Detector for sample irradiation current of electron microscope or the like |
| JP2007206030A (ja) * | 2006-02-06 | 2007-08-16 | Ricoh Co Ltd | 感光体性能測定装置および画像形成装置 |
| JP2008116467A (ja) * | 2007-12-03 | 2008-05-22 | Ulvac Japan Ltd | 表面分析装置、及び表面分析方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5622607Y2 (cs) | 1981-05-27 |