JPS4956645A - - Google Patents
Info
- Publication number
- JPS4956645A JPS4956645A JP5403873A JP5403873A JPS4956645A JP S4956645 A JPS4956645 A JP S4956645A JP 5403873 A JP5403873 A JP 5403873A JP 5403873 A JP5403873 A JP 5403873A JP S4956645 A JPS4956645 A JP S4956645A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02071—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by measuring path difference independently from interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/19—Dichroism
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US25330372A | 1972-05-15 | 1972-05-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4956645A true JPS4956645A (US20100223739A1-20100909-C00005.png) | 1974-06-01 |
Family
ID=22959706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5403873A Pending JPS4956645A (US20100223739A1-20100909-C00005.png) | 1972-05-15 | 1973-05-15 |
Country Status (5)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5867271A (en) * | 1993-11-17 | 1999-02-02 | Advantest Corporation | Michelson interferometer including a non-polarizing beam splitter |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61124834A (ja) * | 1984-11-21 | 1986-06-12 | Sharp Corp | 光応用センサ |
| DE3579238D1 (de) * | 1985-04-24 | 1990-09-20 | Nt Ob Akademii Nauk Sssr | Interferenz-polarisationsrefraktometer. |
| FR2685763B1 (fr) * | 1991-12-27 | 1994-03-25 | Aime Vareille | Procede et dispositif optiques de mesure de distance et leur application au positionnement relatif de pieces. |
| JP6533632B1 (ja) | 2019-03-15 | 2019-06-19 | 日本分光株式会社 | 円二色性測定装置および円二色性測定方法 |
| CN118655091A (zh) * | 2024-08-21 | 2024-09-17 | 西北工业大学 | 一种高灵敏度圆二色谱精密测量装置及方法 |
-
1973
- 1973-05-14 CA CA171,282A patent/CA979638A/en not_active Expired
- 1973-05-15 FR FR7317451A patent/FR2184829B1/fr not_active Expired
- 1973-05-15 DE DE19732324502 patent/DE2324502A1/de active Pending
- 1973-05-15 JP JP5403873A patent/JPS4956645A/ja active Pending
- 1973-05-15 GB GB2296273A patent/GB1428813A/en not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5867271A (en) * | 1993-11-17 | 1999-02-02 | Advantest Corporation | Michelson interferometer including a non-polarizing beam splitter |
| WO2004079313A1 (ja) * | 1993-11-17 | 2004-09-16 | Isao Tokumoto | マイケルソン干渉計 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2324502A1 (de) | 1973-11-29 |
| CA979638A (en) | 1975-12-16 |
| GB1428813A (en) | 1976-03-17 |
| FR2184829A1 (US20100223739A1-20100909-C00005.png) | 1973-12-28 |
| FR2184829B1 (US20100223739A1-20100909-C00005.png) | 1974-05-17 |
