JPS4953094A - - Google Patents

Info

Publication number
JPS4953094A
JPS4953094A JP48052693A JP5269373A JPS4953094A JP S4953094 A JPS4953094 A JP S4953094A JP 48052693 A JP48052693 A JP 48052693A JP 5269373 A JP5269373 A JP 5269373A JP S4953094 A JPS4953094 A JP S4953094A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP48052693A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4953094A publication Critical patent/JPS4953094A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
JP48052693A 1972-06-26 1973-05-14 Pending JPS4953094A (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26611972A 1972-06-26 1972-06-26

Publications (1)

Publication Number Publication Date
JPS4953094A true JPS4953094A (it) 1974-05-23

Family

ID=23013245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48052693A Pending JPS4953094A (it) 1972-06-26 1973-05-14

Country Status (6)

Country Link
JP (1) JPS4953094A (it)
CA (1) CA974651A (it)
DE (1) DE2332100A1 (it)
FR (1) FR2191737A5 (it)
GB (1) GB1431207A (it)
IT (1) IT1006058B (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193936A (ja) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The 放射線による被測定物の組成分析方法
GB8826816D0 (en) * 1988-11-16 1988-12-21 Atomic Energy Authority Uk Method for spectrum matching
CN105354419B (zh) * 2015-11-02 2018-01-30 中国电子科技集团公司第四十一研究所 一种应用于频谱分析仪中的轨迹处理方法
CN115112605B (zh) * 2022-07-21 2023-08-08 湖南五凌电力科技有限公司 变压器油光谱的波长矫正方法、计算机设备及存储介质
CN116609370B (zh) * 2023-04-13 2024-07-05 深圳市埃芯半导体科技有限公司 晶圆量测方法和电子设备

Also Published As

Publication number Publication date
IT1006058B (it) 1976-09-30
DE2332100A1 (de) 1974-01-10
FR2191737A5 (it) 1974-02-01
GB1431207A (en) 1976-04-07
CA974651A (en) 1975-09-16

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