JPS4953094A - - Google Patents
Info
- Publication number
- JPS4953094A JPS4953094A JP48052693A JP5269373A JPS4953094A JP S4953094 A JPS4953094 A JP S4953094A JP 48052693 A JP48052693 A JP 48052693A JP 5269373 A JP5269373 A JP 5269373A JP S4953094 A JPS4953094 A JP S4953094A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US26611972A | 1972-06-26 | 1972-06-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4953094A true JPS4953094A (fr) | 1974-05-23 |
Family
ID=23013245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP48052693A Pending JPS4953094A (fr) | 1972-06-26 | 1973-05-14 |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPS4953094A (fr) |
CA (1) | CA974651A (fr) |
DE (1) | DE2332100A1 (fr) |
FR (1) | FR2191737A5 (fr) |
GB (1) | GB1431207A (fr) |
IT (1) | IT1006058B (fr) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6193936A (ja) * | 1984-10-13 | 1986-05-12 | Furukawa Electric Co Ltd:The | 放射線による被測定物の組成分析方法 |
GB8826816D0 (en) * | 1988-11-16 | 1988-12-21 | Atomic Energy Authority Uk | Method for spectrum matching |
CN105354419B (zh) * | 2015-11-02 | 2018-01-30 | 中国电子科技集团公司第四十一研究所 | 一种应用于频谱分析仪中的轨迹处理方法 |
CN115112605B (zh) * | 2022-07-21 | 2023-08-08 | 湖南五凌电力科技有限公司 | 变压器油光谱的波长矫正方法、计算机设备及存储介质 |
CN116609370B (zh) * | 2023-04-13 | 2024-07-05 | 深圳市埃芯半导体科技有限公司 | 晶圆量测方法和电子设备 |
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1973
- 1973-05-14 JP JP48052693A patent/JPS4953094A/ja active Pending
- 1973-05-28 CA CA172,495A patent/CA974651A/en not_active Expired
- 1973-06-13 FR FR7322348A patent/FR2191737A5/fr not_active Expired
- 1973-06-19 GB GB2892573A patent/GB1431207A/en not_active Expired
- 1973-06-20 IT IT2561073A patent/IT1006058B/it active
- 1973-06-23 DE DE19732332100 patent/DE2332100A1/de active Pending
Also Published As
Publication number | Publication date |
---|---|
GB1431207A (en) | 1976-04-07 |
DE2332100A1 (de) | 1974-01-10 |
CA974651A (en) | 1975-09-16 |
IT1006058B (it) | 1976-09-30 |
FR2191737A5 (fr) | 1974-02-01 |