JPS4945650A - - Google Patents

Info

Publication number
JPS4945650A
JPS4945650A JP6098673A JP6098673A JPS4945650A JP S4945650 A JPS4945650 A JP S4945650A JP 6098673 A JP6098673 A JP 6098673A JP 6098673 A JP6098673 A JP 6098673A JP S4945650 A JPS4945650 A JP S4945650A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6098673A
Other languages
Japanese (ja)
Other versions
JPS5440183B2 (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4945650A publication Critical patent/JPS4945650A/ja
Publication of JPS5440183B2 publication Critical patent/JPS5440183B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/83—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption
    • G11C29/832—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption with disconnection of faulty elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Static Random-Access Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP6098673A 1972-06-30 1973-06-01 Expired JPS5440183B2 (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26782772A 1972-06-30 1972-06-30

Publications (2)

Publication Number Publication Date
JPS4945650A true JPS4945650A (en:Method) 1974-05-01
JPS5440183B2 JPS5440183B2 (en:Method) 1979-12-01

Family

ID=23020290

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6098673A Expired JPS5440183B2 (en:Method) 1972-06-30 1973-06-01

Country Status (7)

Country Link
US (1) US3750116A (en:Method)
JP (1) JPS5440183B2 (en:Method)
CA (1) CA1019835A (en:Method)
DE (1) DE2332555A1 (en:Method)
FR (1) FR2191203B1 (en:Method)
GB (1) GB1418552A (en:Method)
IT (1) IT982699B (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6356498B1 (en) 1996-07-24 2002-03-12 Micron Technology, Inc. Selective power distribution circuit for an integrated circuit
JP2009093205A (ja) * 2009-02-02 2009-04-30 Hinomoto Gosei Jushi Seisakusho:Kk 分子模型

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3986179A (en) * 1975-06-30 1976-10-12 Honeywell Information Systems, Inc. Fault-tolerant CCD memory chip
JPS5857838B2 (ja) * 1980-12-29 1983-12-22 富士通株式会社 デコ−ド回路
US4963769A (en) * 1989-05-08 1990-10-16 Cypress Semiconductor Circuit for selective power-down of unused circuitry
US20030074610A1 (en) * 2001-10-16 2003-04-17 Umax Data Systems Inc. Method for improving utilization of a defective memory device in an image processing system
KR100481849B1 (ko) * 2001-12-04 2005-04-11 삼성전자주식회사 용량 변경이 가능한 캐쉬 메모리 및 이를 구비한 프로세서칩

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3402398A (en) * 1964-08-31 1968-09-17 Bunker Ramo Plural content addressed memories with a common sensing circuit
US3422402A (en) * 1965-12-29 1969-01-14 Ibm Memory systems for using storage devices containing defective bits
US3588830A (en) * 1968-01-17 1971-06-28 Ibm System for using a memory having irremediable bad bits
US3659275A (en) * 1970-06-08 1972-04-25 Cogar Corp Memory correction redundancy system
US3688280A (en) * 1970-09-22 1972-08-29 Ibm Monolithic memory system with bi-level powering for reduced power consumption

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6356498B1 (en) 1996-07-24 2002-03-12 Micron Technology, Inc. Selective power distribution circuit for an integrated circuit
JP2009093205A (ja) * 2009-02-02 2009-04-30 Hinomoto Gosei Jushi Seisakusho:Kk 分子模型

Also Published As

Publication number Publication date
JPS5440183B2 (en:Method) 1979-12-01
CA1019835A (en) 1977-10-25
FR2191203A1 (en:Method) 1974-02-01
DE2332555A1 (de) 1974-01-17
FR2191203B1 (en:Method) 1976-04-30
IT982699B (it) 1974-10-21
US3750116A (en) 1973-07-31
GB1418552A (en) 1975-12-24

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