JPS4890772A - - Google Patents
Info
- Publication number
- JPS4890772A JPS4890772A JP2330772A JP2330772A JPS4890772A JP S4890772 A JPS4890772 A JP S4890772A JP 2330772 A JP2330772 A JP 2330772A JP 2330772 A JP2330772 A JP 2330772A JP S4890772 A JPS4890772 A JP S4890772A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Recording Measured Values (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2330772A JPS5338628B2 (en:Method) | 1972-03-07 | 1972-03-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2330772A JPS5338628B2 (en:Method) | 1972-03-07 | 1972-03-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4890772A true JPS4890772A (en:Method) | 1973-11-27 |
| JPS5338628B2 JPS5338628B2 (en:Method) | 1978-10-17 |
Family
ID=12106930
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2330772A Expired JPS5338628B2 (en:Method) | 1972-03-07 | 1972-03-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5338628B2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60185170A (ja) * | 1984-02-16 | 1985-09-20 | Yokogawa Hewlett Packard Ltd | スペクトラム分析器 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58156254U (ja) * | 1982-04-14 | 1983-10-19 | 日本特殊陶業株式会社 | 圧電レベルセンサ |
-
1972
- 1972-03-07 JP JP2330772A patent/JPS5338628B2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60185170A (ja) * | 1984-02-16 | 1985-09-20 | Yokogawa Hewlett Packard Ltd | スペクトラム分析器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5338628B2 (en:Method) | 1978-10-17 |