JPS4843059B1 - - Google Patents

Info

Publication number
JPS4843059B1
JPS4843059B1 JP45013187A JP1318770A JPS4843059B1 JP S4843059 B1 JPS4843059 B1 JP S4843059B1 JP 45013187 A JP45013187 A JP 45013187A JP 1318770 A JP1318770 A JP 1318770A JP S4843059 B1 JPS4843059 B1 JP S4843059B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45013187A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4843059B1 publication Critical patent/JPS4843059B1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP45013187A 1969-02-17 1970-02-17 Pending JPS4843059B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US79984169A 1969-02-17 1969-02-17

Publications (1)

Publication Number Publication Date
JPS4843059B1 true JPS4843059B1 (ja) 1973-12-17

Family

ID=25176902

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45013187A Pending JPS4843059B1 (ja) 1969-02-17 1970-02-17

Country Status (5)

Country Link
US (1) US3541441A (ja)
JP (1) JPS4843059B1 (ja)
DE (1) DE2007025A1 (ja)
FR (1) FR2033863A5 (ja)
GB (1) GB1282228A (ja)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3655959A (en) * 1970-08-17 1972-04-11 Computer Test Corp Magnetic memory element testing system and method
US3659087A (en) * 1970-09-30 1972-04-25 Ibm Controllable digital pulse generator and a test system incorporating the pulse generator
GB1379588A (en) * 1971-12-01 1975-01-02 Int Computers Ltd Systems for testing electrical devices
US3826909A (en) * 1973-03-29 1974-07-30 Ncr Dynamic comparison tester for go-no-go testing of digital circuit packages in normal environment
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester
US4122995A (en) * 1977-08-02 1978-10-31 Burroughs Corporation Asynchronous digital circuit testing system
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
IT1140156B (it) * 1981-12-15 1986-09-24 Honeywell Inf Systems Apparato di verifica della immunita' ai disturbi dinamici di circuiti integrati digitali
US4604531A (en) * 1983-07-25 1986-08-05 International Business Machines Corporation Imbalance circuits for DC testing
US4686628A (en) * 1984-07-19 1987-08-11 Fairchild Camera & Instrument Corp. Electric device or circuit testing method and apparatus
JPH0760400B2 (ja) * 1986-01-07 1995-06-28 株式会社日立製作所 論理回路の診断方法
JP2604606B2 (ja) * 1987-11-24 1997-04-30 株式会社アドバンテスト 回路試験装置
US8037371B1 (en) 2007-05-14 2011-10-11 National Semiconductor Corporation Apparatus and method for testing high-speed serial transmitters and other devices
US7809517B1 (en) * 2007-09-07 2010-10-05 National Semiconductor Corporation Apparatus and method for measuring phase noise/jitter in devices under test

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1361874A (fr) * 1962-12-07 1964-05-29 Appareil d'essai automatique de sous-ensembles de circuits logiques pour machines àcalculer électroniques numériques

Also Published As

Publication number Publication date
GB1282228A (en) 1972-07-19
FR2033863A5 (ja) 1970-12-04
US3541441A (en) 1970-11-17
DE2007025A1 (de) 1970-09-03

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