JPS4832139B1 - - Google Patents
Info
- Publication number
- JPS4832139B1 JPS4832139B1 JP44003333A JP333369A JPS4832139B1 JP S4832139 B1 JPS4832139 B1 JP S4832139B1 JP 44003333 A JP44003333 A JP 44003333A JP 333369 A JP333369 A JP 333369A JP S4832139 B1 JPS4832139 B1 JP S4832139B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02061—Reduction or prevention of effects of tilts or misalignment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US69882168A | 1968-01-18 | 1968-01-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4832139B1 true JPS4832139B1 (ja) | 1973-10-04 |
Family
ID=24806795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP44003333A Pending JPS4832139B1 (ja) | 1968-01-18 | 1969-01-18 |
Country Status (9)
Country | Link |
---|---|
US (1) | US3597091A (ja) |
JP (1) | JPS4832139B1 (ja) |
BE (1) | BE727001A (ja) |
CH (1) | CH506047A (ja) |
DE (1) | DE1902290A1 (ja) |
FR (1) | FR2000401A1 (ja) |
GB (1) | GB1254911A (ja) |
IL (1) | IL31441A0 (ja) |
NL (1) | NL6900796A (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3941480A (en) * | 1974-02-08 | 1976-03-02 | The Gerber Scientific Instrument Company | Work locating system and method with temperature and other compensation capabilities |
US4056323A (en) * | 1975-04-02 | 1977-11-01 | Ludman Jacques E | Interferometer optical system |
US4280054A (en) * | 1979-04-30 | 1981-07-21 | Varian Associates, Inc. | X-Y Work table |
EP0341960A3 (en) * | 1988-05-10 | 1990-10-03 | Hewlett-Packard Company | Method for improving performance of a laser interferometer in the presence of wavefront distortion |
JP2000283722A (ja) | 1999-03-29 | 2000-10-13 | Ando Electric Co Ltd | 光学部品駆動装置と光干渉計 |
DE10118392A1 (de) * | 2001-04-13 | 2002-11-07 | Zeiss Carl | System und Verfahren zum Bestimmen einer Position oder/und Orientierung zweier Objekte relativ zueinander sowie Strahlführungsanordnung, Interferometeranordnung und Vorrichtung zum Ändern einer optischen Weglänge zum Einsatz in einem solchen System und Verfahren |
JP4198929B2 (ja) * | 2002-03-27 | 2008-12-17 | パイオニア株式会社 | レーザ測長器及びレーザ測長方法 |
US7369916B2 (en) | 2002-04-18 | 2008-05-06 | Black & Decker Inc. | Drill press |
US7073268B1 (en) | 2002-04-18 | 2006-07-11 | Black & Decker Inc. | Level apparatus |
US8004664B2 (en) | 2002-04-18 | 2011-08-23 | Chang Type Industrial Company | Power tool control system |
US7359762B2 (en) | 2002-04-18 | 2008-04-15 | Black & Decker Inc. | Measurement and alignment device including a display system |
US20060076385A1 (en) | 2002-04-18 | 2006-04-13 | Etter Mark A | Power tool control system |
US6937336B2 (en) * | 2002-08-15 | 2005-08-30 | Black & Decker, Inc. | Optical alignment system for power tool |
US20030233921A1 (en) | 2002-06-19 | 2003-12-25 | Garcia Jaime E. | Cutter with optical alignment system |
US7137327B2 (en) | 2002-10-31 | 2006-11-21 | Black & Decker Inc. | Riving knife assembly for a dual bevel table saw |
US7290474B2 (en) | 2003-04-29 | 2007-11-06 | Black & Decker Inc. | System for rapidly stopping a spinning table saw blade |
US20050113701A1 (en) * | 2003-11-26 | 2005-05-26 | Scimed Life Systems, Inc. | Rotating measuring device |
US7243440B2 (en) | 2004-10-06 | 2007-07-17 | Black & Decker Inc. | Gauge for use with power tools |
DE102008001473B3 (de) * | 2008-04-30 | 2009-12-31 | Robert Bosch Gmbh | Optische Anordnung zur Beleuchtung eines Messobjektes, interferometrische Anordnung zur Vermessung von Flächen eines Messobjektes |
DE102008001482A1 (de) * | 2008-04-30 | 2009-11-05 | Robert Bosch Gmbh | Interferometrische Anordnung sowie Verfahren zum Einstellen eines Gangunterschieds |
GB201000775D0 (en) | 2010-01-18 | 2010-03-03 | Stfc Science & Technology | Interferometer spectrometer |
JP2011215016A (ja) * | 2010-03-31 | 2011-10-27 | Fujifilm Corp | 非球面形状測定装置 |
DE102011101415A1 (de) * | 2011-05-10 | 2012-11-15 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Optische Anordnung zur Laserinterferenzstrukturierung einer Probe mit Strahlführung gleicher Weglänge |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2151631A (en) * | 1936-05-07 | 1939-03-21 | Williams William Ewart | Optical interferometer |
US2527338A (en) * | 1946-10-12 | 1950-10-24 | American Cyanamid Co | Diffraction grating ruling engine |
US2841049A (en) * | 1955-03-30 | 1958-07-01 | Perkin Elmer Corp | Interferometer |
US3409375A (en) * | 1964-10-21 | 1968-11-05 | Cutler Hammer Inc | Gauging interferometer systems |
-
1968
- 1968-01-18 US US698821A patent/US3597091A/en not_active Expired - Lifetime
-
1969
- 1969-01-13 GB GB0855/69A patent/GB1254911A/en not_active Expired
- 1969-01-14 CH CH45469A patent/CH506047A/fr not_active IP Right Cessation
- 1969-01-17 NL NL6900796A patent/NL6900796A/xx unknown
- 1969-01-17 FR FR6900821A patent/FR2000401A1/fr not_active Withdrawn
- 1969-01-17 IL IL31441A patent/IL31441A0/xx unknown
- 1969-01-17 DE DE19691902290 patent/DE1902290A1/de active Pending
- 1969-01-17 BE BE727001D patent/BE727001A/xx unknown
- 1969-01-18 JP JP44003333A patent/JPS4832139B1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
FR2000401A1 (ja) | 1969-09-05 |
NL6900796A (ja) | 1969-07-22 |
US3597091A (en) | 1971-08-03 |
IL31441A0 (en) | 1969-03-27 |
CH506047A (fr) | 1971-04-15 |
GB1254911A (en) | 1971-11-24 |
DE1902290A1 (de) | 1969-09-04 |
BE727001A (ja) | 1969-07-17 |