JPS46271A - - Google Patents
Info
- Publication number
- JPS46271A JPS46271A JP118871A JP118871A JPS46271A JP S46271 A JPS46271 A JP S46271A JP 118871 A JP118871 A JP 118871A JP 118871 A JP118871 A JP 118871A JP S46271 A JPS46271 A JP S46271A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2637—Circuits therefor for testing other individual devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49004—Electrical device making including measuring or testing of device or component part
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US377170A | 1970-01-19 | 1970-01-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS46271A true JPS46271A (OSRAM) | 1971-08-24 |
| JPS509376B1 JPS509376B1 (OSRAM) | 1975-04-12 |
Family
ID=21707508
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP46001188A Pending JPS509376B1 (OSRAM) | 1970-01-19 | 1971-01-19 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US3605015A (OSRAM) |
| JP (1) | JPS509376B1 (OSRAM) |
| BE (1) | BE760897A (OSRAM) |
| FR (1) | FR2080914B1 (OSRAM) |
| GB (1) | GB1319032A (OSRAM) |
| NL (1) | NL7100701A (OSRAM) |
| SU (1) | SU504516A1 (OSRAM) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3731192A (en) * | 1971-05-28 | 1973-05-01 | Bell Telephone Labor Inc | Method and apparatus for analyzing semiconductors |
| US4208624A (en) * | 1978-08-09 | 1980-06-17 | Bell Telephone Laboratories, Incorporated | Method and apparatus for investigating dielectric semiconductor materials |
| JP2886176B2 (ja) * | 1989-03-23 | 1999-04-26 | 三菱電機株式会社 | 埋め込みチャネルの物性特性測定法 |
| HU213198B (en) * | 1990-07-12 | 1997-03-28 | Semilab Felvezetoe Fiz Lab Rt | Method and apparatus for measuring concentration of charge carriers in semiconductor materials |
| JP2702807B2 (ja) * | 1990-08-09 | 1998-01-26 | 東芝セラミックス株式会社 | 半導体中の深い不純物準位の測定方法及びその装置 |
| DK146692D0 (da) * | 1992-12-07 | 1992-12-07 | Petr Viscor | Fremgangsmaade og apparat til bestemmelse af karakteristiske elektriske materialeparametre for halvledende materialer |
| US5521839A (en) * | 1993-09-02 | 1996-05-28 | Georgia Tech Research Corporation | Deep level transient spectroscopy (DLTS) system and method |
| US5493231A (en) * | 1994-10-07 | 1996-02-20 | University Of North Carolina | Method and apparatus for measuring the barrier height distribution in an insulated gate field effect transistor |
| DE10126300C1 (de) * | 2001-05-30 | 2003-01-23 | Infineon Technologies Ag | Verfahren und Vorrichtung zum Messen einer Temperatur in einem integrierten Halbleiterbauelement |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2942329A (en) * | 1956-09-25 | 1960-06-28 | Ibm | Semiconductor device fabrication |
-
1970
- 1970-01-19 US US3771A patent/US3605015A/en not_active Expired - Lifetime
- 1970-12-28 BE BE760897A patent/BE760897A/xx unknown
-
1971
- 1971-01-08 FR FR7100571A patent/FR2080914B1/fr not_active Expired
- 1971-01-13 GB GB161971A patent/GB1319032A/en not_active Expired
- 1971-01-15 SU SU1614630A patent/SU504516A1/ru active
- 1971-01-19 NL NL7100701A patent/NL7100701A/xx unknown
- 1971-01-19 JP JP46001188A patent/JPS509376B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| FR2080914B1 (OSRAM) | 1974-10-31 |
| GB1319032A (en) | 1973-05-31 |
| NL7100701A (OSRAM) | 1971-07-21 |
| BE760897A (fr) | 1971-05-27 |
| SU504516A1 (OSRAM) | 1976-02-25 |
| JPS509376B1 (OSRAM) | 1975-04-12 |
| DE2102182B2 (de) | 1972-11-02 |
| DE2102182A1 (de) | 1971-07-22 |
| US3605015A (en) | 1971-09-14 |
| FR2080914A1 (OSRAM) | 1971-11-26 |