JPH1165870A - Fault information control system of diagnostic device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To diagnose more than one diagnosed device at a time and to shorten the diagnostic time for mass-produced devices by unitarily managing fault data of diagnosed devices by an inspecting device body according to the number uniquely assigned to the diagnosed devices. SOLUTION: The inspecting device body 100 is connected to the diagnosed devices 110 by a line 120, etc. If a fault occurs to a diagnosed device 110, the inspecting device body 100 stores the specific number (manufacture number of the diagnosed device and the number uniquely assigned to the device like a MAC address used for line connection) of the diagnosed device 110 and fault information as fault data and unitarilly manages the fault data according to the specific number. When the diagnosed device 110 where the fault has occurred is completed is rediagnosed after its restoration, only the test item part of the diagnosed device 110 to which the fault has occurred is reexecuted on the basis of the fault data on the diagnosed device 110 stored in the inspecting device body 100 for the diagnosed device 110.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a diagnostic device for testing electronic equipment, and more particularly to a diagnostic control system in which one or a plurality of devices under test are connected to a testing device main body. On failure data processing and failure data management.

[0002]

2. Description of the Related Art Conventionally, a diagnostic device of this type has been connected to a device to be diagnosed and diagnosed, and if a failure occurs in the device to be diagnosed, it is removed as a defective product at that time. Alternatively, diagnosis can be interrupted even if a failure occurs by storing the failure data in the data storage device such as a memory or hard disk built into the tester in the order in which the failure occurred in order to enhance the ability to analyze the failure. There is one that continues without performing and collects and analyzes all failure data after the diagnosis is completed. In this case, the failure data had to be temporarily stored until the diagnosis was completed, and there was no consideration of centrally managing the fault data until the repair was completed. In other words, when re-diagnosing a device to be diagnosed whose fault has been repaired, all the diagnostic items must be performed, and there is no means to automatically perform only the diagnosis of the portion where the fault has occurred. A related system of this type is disclosed in Japanese Patent Application Laid-Open No. H4-111731.

[0003]

SUMMARY OF THE INVENTION Therefore, the problem to be solved by the present invention is to diagnose a plurality of devices to be diagnosed at once by integrally managing the fault data of the devices to be diagnosed. The purpose is to reduce the diagnostic time of the device to be diagnosed after correction.

[0004]

SUMMARY OF THE INVENTION The present invention relates to a case where the test apparatus main body of the test diagnostic apparatus is connected to a plurality of devices to be diagnosed by a line or the like, and when a fault occurs in the device to be diagnosed. The inspection apparatus main body uses the unique number of the device to be diagnosed (for example, a serial number assigned to the device to be diagnosed or a number uniquely assigned to the device such as a MAC address used for line connection) and the fault information as fault data. Means for centrally managing the failure data based on the unique number,
After the repair of the failed device has been completed, if the failed device is to be re-diagnosed, the failed device based on the failure data of the failed device stored in the test device main body for the failed device to be diagnosed again. Means for re-executing only the test item part in which the failure of the device to be diagnosed has occurred.

[0005]

DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described. FIG. 1 is an overall view of an inspection diagnostic apparatus 10 according to the present invention. The inspection apparatus main body 100 of the inspection diagnostic apparatus, the devices to be diagnosed 110 to 11n diagnosed by the inspection diagnostic apparatus, the inspection apparatus main body 100 and the diagnosed apparatus. And a line 120 connecting the devices 110 to 11n. The inspection apparatus main body 100 includes an inspection apparatus main body control program 600, a failure data management table 300 for managing failure information, and a failure data storage area 40.
0 is provided. The diagnostic device 110 is executed by the diagnostic device control program 700. Inspection device body 100
And the devices to be diagnosed 110 to 11n transmit frames using the line 120. FIG. 2 shows a frame transmitted using the line 120. The failure information frame 200 is
A frame identifier 201, a unique number of the device to be diagnosed (for example, a serial number assigned to the device to be diagnosed or a number uniquely assigned to the device such as a MAC address used for line connection) 202, a revision 203 of the device to be diagnosed , Test item number 204 when a failure occurs, failure information 2 when a failure occurs
05 from the diagnostic apparatus 110 to the test apparatus main body 10
0 is used to transmit fault information. The test control frame 210 includes a frame identifier 211, a unique number 212 of the device to be diagnosed, and test start / end data 213.
The start or end of diagnosis of the device to be diagnosed
Used to communicate to Test information frame 220
Are the frame identifier 221, the diagnostic device unique number 22
2, a failure information presence / absence flag 223, and a test item number 224 when a failure occurs, and is used to transmit diagnostic information to be performed from the inspection apparatus main body 100 to the apparatus to be diagnosed. FIG. 3 shows a fault data management area prepared in the test apparatus main body 100 of the test diagnostic apparatus. This area is
It comprises a fault data management table 300 for managing fault data for each device to be diagnosed, and a fault data storage area 400 for storing fault data sent from the device to be diagnosed. The failure data management table 300 includes a unique number 301 of the device to be diagnosed, a test flag 302 indicating a test execution status of the device to be diagnosed, and an area address 303 holding an address of an area for storing the failure data of the device to be diagnosed. . FIG. 4 shows an inspection apparatus main body 100 of the inspection diagnostic apparatus 10.
Shows a control flow that operates after receiving a frame from the device under diagnosis 110. FIG. 5 shows an outline of a diagnosis control flow in the device under diagnosis 110. Next, regarding the operation of the present invention,
This will be described mainly with reference to FIGS. Inspection device body 100
Is connected to one or more devices to be diagnosed (110 to 11n) via a line 120. As an example, an operation method when the device to be diagnosed 110 is connected to the inspection device main body 100 will be described. The inspection apparatus main body 100 waits for a frame from the connected apparatus to be diagnosed 110 after the power is set by the inspection operator (601 in FIG. 4). When a frame is received, first, a frame identifier is determined, and the frame is a fault information frame 200 in which fault information is stored.
Or the test control frame 210 indicating whether the diagnosis of the device to be diagnosed is "start" or "end" (60 in FIG. 4).
2). When the information that the test start end flag 213 of the test control frame 210 is set to “start” is reported from the device under diagnosis 110 to the device main body 100, the device main body 100 is transmitted from the device under diagnosis 110. It determines that the received frame is the test control frame 210 indicating the start of diagnosis of the device under diagnosis 110, and acquires the unique number 202 of the device under diagnosis stored in the frame. After that, the unique number 301 of the device to be diagnosed stored in the fault data management table 300 stored in the test apparatus main body 100 is sequentially obtained, and is compared with the unique number 202 of the device to be diagnosed obtained from the test control frame 210. Do
(608 in FIG. 4). Normally, when the diagnosis target device 110 is diagnosed for the first time by the diagnostic test device 10, the test device main body 1
The device unique number of the device under diagnosis 110 is not registered in the fault data management table 300 in 00. For this reason, the inspection apparatus main body 100 uses the failure data management table 3
A new area of the device identification number of the device under diagnosis 110 is newly provided in 00 (609 and 610 in FIG. 4). Thereafter, the test information frame 22 is transmitted to inform the device under diagnosis 110 that there is no fault information of the device under diagnosis 110 in the past.
The fault information presence / absence flag 223 of “0” is set to “none”, and the test information frame 220 is transmitted to the device under diagnosis 110.
(611, 613, 614 in FIG. 4). The device to be diagnosed 110 that has received this frame determines the failure information presence / absence flag 223 from the received frame and determines that it is “absent”, and then sets the diagnostic items to be executed from the beginning to the end (fifth item). 704, 705, 706 in the figure). Diagnostic device 1
10 sequentially executes the set diagnosis items (the fifth diagnosis item).
708 in the figure). Next, when the device to be diagnosed 110 detects a failure during the execution of the diagnosis, the device to be diagnosed 110 acquires the failure information when the failure is detected during the diagnosis. A fault information frame 200 is created to send the obtained fault information to the test apparatus main body 100. At that time, the failure information frame 20
In 0, a unique number 202 of the device to be diagnosed, a device revision 203 of the device to be diagnosed, a test item number 204 when a fault is detected, and fault information 205 are stored (710 in FIG. 5). Thereafter, the device under diagnosis 110 is
Then, the created failure information frame 200 is transmitted to 00 (711 in FIG. 5). The device to be diagnosed 110 repeats the above processing to execute the diagnosis to the end (FIG.
712). Failure information frame 20 from device under diagnosis 110
When the inspection apparatus main body 100 that has received 0 receives the frame 201 from the received frame identifier 201 and determines that the received frame is the failure information frame 200 (602 in FIG. 4), the diagnosis target apparatus stored in the frame is detected. Unique number 2
Get 02. Thereafter, the unique number 301 of the device to be diagnosed stored in the fault data management table 300 stored in the inspection device main body 100 is sequentially obtained, and the diagnostic device of the device to be diagnosed 110 of the device to be diagnosed 110 obtained from the fault information frame 200 is acquired. Comparison with the unique number 202 is performed (616 in FIG. 4).
If there is a match, the failure data management table 300 refers to the area address 303 of the failure data storage area with the unique number 301 of the matched device to be diagnosed, and confirms whether the failure data has already been stored in the corresponding area. The test item number 204 and the fault information 205 stored in the fault information frame 200 received in the fault data storage area 400 where no data is stored are stored (61 in FIG. 4).
7). When the diagnosis of the device under diagnosis 110 is completed, the test control frame 2 in which the test is completed is set by the device under diagnosis 100.
10 is transmitted to the inspection apparatus main body 100. The inspection apparatus main body 100 obtains the unique number 212
Data management table 300 owned by the user
The test flag 302 of the area which matches with the device unique number 301 in FIG. 4 (604 in FIG. 4) is turned off (60 in FIG. 4).
7), fault data storage area 400 managed by this area
Check whether failure information is stored in the file (6 in FIG. 4).
05). If the failure information is not stored, the device unique number of the device under diagnosis 110 is deleted (60 in FIG. 4).
6). If the fault information is stored, this area is saved as it is and saved for execution of diagnosis when the repair of the device under diagnosis 110 is completed. This is a case where a failure has occurred in the diagnostic device 110 in the diagnostic device 10 for main inspection, and after the diagnostic device 10 has been repaired,
In the case where the diagnosis is performed by the diagnostic device 10 in the past, the diagnostic device 10 is diagnosed by the diagnostic device for inspection 10 in the past, and if a failure occurs in the diagnostic device 110 during the diagnosis, the diagnostic device The device unique number 110 and its fault information are stored. The information on the start of diagnosis of the test control frame 210 from the device under diagnosis 110
00, the test apparatus main body 100 determines that the frame transmitted from the device under diagnosis 110 is the test control frame 210 indicating the start of diagnosis of the device under diagnosis 110, and stores the frame in the frame. The unique number 212 of the device to be diagnosed is acquired (602 and 603 in FIG. 4).
Thereafter, the unique number 301 of the device to be diagnosed stored in the fault data management table 300 stored in the inspection device main body 100 is sequentially acquired, and the test control frame 210 is obtained.
With the unique number 212 of the device to be diagnosed obtained from
(608 in FIG. 4). If there is a match, the presence / absence of failure information is confirmed by referring to the area address 303 in the area of the unique number 301 of the matched device to be diagnosed (611 in FIG. 4). Since a fault has occurred in the past, the fault information is in the fault data storage area 400. A test item number at the time of occurrence of a failure is extracted from the failure information and stored in a test information frame 220 transmitted to the device under diagnosis 110, and a failure information presence / absence flag indicating that the failure information is present in the failure data storage area 400. Set 223 to "Yes". (612 in FIG. 4). The above processing is performed for all the fault information of the device under diagnosis 110. When the creation of the test information frame 220 to be transmitted to the device under diagnosis 110 is completed,
00 transmits the test information frame 220 to the device under diagnosis 110 (614 in FIG. 4). The device under diagnosis 110
Is the test information frame 220 from the inspection apparatus main body 100.
Is received (704 in FIG. 5), the frame identifier 221
After confirming the failure information, the failure information presence / absence flag 2 in the test information frame 220 is used to confirm whether a failure has occurred in the past.
23 (705 in FIG. 5), and the failure information presence flag 2
If “23” is “present”, a test number in which a failure has occurred is extracted from the test number 224 at the time of failure occurrence in the test information frame 220, and is set as a test item number to be executed by the device under diagnosis 110 (fifth). 707 in the figure). The device to be diagnosed 110 executes the test item number set here and performs diagnosis (708 in FIG. 5). As a result, only the test items for which a failure has occurred in the past can be performed, and the execution time of the retest can be simplified. Also, when performing a retest of the device under diagnosis 110 after the repair, if it is desired to perform all the test items, not only the items in which the failure has occurred in the past, the inspection apparatus main body 100 can specify that all the test items are to be performed. It is possible to specify it with a command etc. In addition to the purpose of shortening the diagnosis time as described above, it can be applied to the purpose of strengthening the diagnosis. In this case, when the diagnosis is performed again, when the test item is executed by applying an external stress (temperature change, voltage change, etc.) together with the normal diagnosis test, the diagnosis of the faulty part is strengthened. As described above, the test apparatus main body 100 and the device under diagnosis 110
In the system of the present invention, the same control is performed even when one or a plurality of devices to be diagnosed are connected, and the fault information generated during the diagnosis is centrally managed in the system of the present invention. Can do it.

[0006]

As described above, according to the present invention, failure data of a plurality of devices to be diagnosed are centrally managed by the inspection device body based on numbers uniquely assigned to the devices to be diagnosed. Diagnosis of a plurality of devices to be diagnosed can be performed at once, which has the effect of shortening the diagnosis time for mass-produced devices. In addition, since it is possible to extract only the test item in which a failure has occurred based on the centrally managed failure information, it is possible to reduce the time required for re-diagnosis of the device to be diagnosed after correction. effective.

[Brief description of the drawings]

FIG. 1 is a diagram showing a basic configuration of the present invention.

FIG. 2 is a diagram showing a format of a frame transferred between an inspection apparatus main body and a device to be diagnosed when the present invention is implemented.

FIG. 3 is a diagram showing a fault information storage area for storing fault information in the inspection apparatus main body shown in FIG. 1;

FIG. 4 is a flowchart showing a process in which the test apparatus main body of FIG. 1 stores fault information in a fault information area and a process of creating information to be sent to a device to be diagnosed at the time of a retest from the stored fault information. .

FIG. 5 is a flowchart of a process for performing diagnostic control in the device to be diagnosed in FIG. 1;

[Explanation of symbols]

 10 ··· Test diagnostic device 100 · · · Test device main body of test diagnostic device 110 to 11 n · · · Device under diagnosis 120 · · · Line 200 · · · Fault information frame 201 · · · Frame identifier 202 · ··· Unique number of the device to be diagnosed 203 ··· Revision of the device to be diagnosed 204 ··· Test item number at the time of occurrence of a failure 205 ··· Failure information at the time of occurrence of a failure 210 ··· Test control frame 211 ··· Frame identifier 212 ... unique number of the device to be diagnosed 213 ... test start / end data 220 ... test information frame 221 ... frame identifier 222 ... unique number of the device to be diagnosed 223 ... fault information presence / absence flag 224 ... Test item number at the time of occurrence of a failure 300... Failure data management table 301... · Test flag 303 ... area address 400 ... fault data storage area 600 ... inspection apparatus main body control program 700 ... the diagnostic device control program

Claims (1)

[Claims] 1. A method for controlling fault information in a diagnostic device for inspection of an electronic apparatus, wherein the diagnostic device main body of the diagnostic device for inspection is connected to one or more devices to be diagnosed. When an error occurs in the device to be diagnosed, the device to be diagnosed stores the unique number of the device to be diagnosed and fault information in fault data provided in the test device body, and the test device main body stores the fault number stored in the fault data. Diagnosis control method characterized by centralized management of fault data based on the device's unique number. After the repair of the failed device to be diagnosed is completed, the diagnostic device is diagnosed again.
Diagnostic control, characterized in that a test item in which a failure has occurred in the device to be diagnosed can be selected and executed based on the failure data of the device to be diagnosed stored in the test device main body for the relevant device to be diagnosed. method. This is a case in which after the repair of the failed device to be diagnosed is completed, the diagnostic device is diagnosed again. A diagnostic control method characterized in that a test item in which a failure has occurred in the device to be diagnosed can be selectively executed by applying stress.